公开(公告)号：US20240070007A1

公开(公告)日：2024-02-29

申请号：US18223465

申请日：2023-07-18

Applicant: Micron Technology, Inc.

Inventor： Aaron Jannusch ,  Mow Yiak Goh ,  Robin K. Mitra

IPC: G06F11/07

CPC classification number: G06F11/0772

Abstract: Memory with fail indicators, and associated systems, devices, and methods are disclosed herein. In one embodiment, a system includes a plurality of memory systems and a host device. At least one of the memory systems includes a fail indicator connected to the host device via a side channel of the system. The host device is configured to detect an occurrence of a failure on the at least one memory system and to initiate activation of the fail indicator. The side channel can be an I2C or I3C side channel. The fail indicator, when activated, can provide a visual indication of the failure. For example, the fail indicator can include an LED that can be activated to emit light and provide an indication of the failure. A color of the light can correspond to a type, occurrence, or location of the failure on the at least one memory system.