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    LEARNING METHOD
    2.
    发明公开
    LEARNING METHOD 审中-公开

    公开(公告)号：US20240281712A1

    公开(公告)日：2024-08-22

    申请号：US18566795

    申请日：2021-06-07

    Applicant: NEC Corporation

    Inventor： Yuji KOBAYASHI ,  Yoshiaki SAKAE ,  Hiroki TAGATO ,  Takashi KONASHI ,  Jun NISHIOKA ,  Jun KODAMA ,  Etsuko ICHIHARA

    IPC: G06N20/00

    CPC classification number: G06N20/00

    Abstract: A learning device 100 according to this invention includes: a classification unit 121 configured to classify measurement value data measuring performance of an object on the basis of situation data each representing a situation of the object when the measurement value data are measured; a selection unit 122 configured to select the measurement value data from each of the classifications according to the number of the measurement value data for each of the classifications; and a learning unit 123 configured to perform machine learning on the basis of the selected measurement value data.

    COMMUNICATION ROUTE SETTING METHOD
    3.
    发明申请
    COMMUNICATION ROUTE SETTING METHOD 有权

    公开(公告)号：US20250096889A1

    公开(公告)日：2025-03-20

    申请号：US18727379

    申请日：2022-01-26

    Applicant: NEC Corporation

    Inventor： Jun KODAMA ,  Yoshiaki SAKAE ,  Hiroki TAGATO ,  Takashi KONASHI ,  Jun NISHIOKA ,  Yuji KOBAYASHI ,  Etsuko ICHIHARA

    IPC: H04B10/077 ,  H04L45/02

    Abstract: A communication route setting device 100 of the present invention includes an optical signal acquisition unit 121 that acquires an optical signal on a transmission path in a network in which optical communication devices are connected to each other via an optical transmission path, a condition determination unit 122 that determines a physical condition of at least one object of the optical transmission path and the optical communication devices on the basis of the optical signal, and a route setting unit 123 that sets a communication route for transmitting the optical signal on the network on the basis of the determined physical condition.

    ABNORMALITY DIAGNOSIS APPARATUS, ABNORMALITY DIAGNOSIS METHOD, AND STORAGE MEDIUM
    6.
    发明申请
    ABNORMALITY DIAGNOSIS APPARATUS, ABNORMALITY DIAGNOSIS METHOD, AND STORAGE MEDIUM 有权

    公开(公告)号：US20250050442A1

    公开(公告)日：2025-02-13

    申请号：US18715789

    申请日：2021-12-07

    Applicant: NEC Corporation

    Inventor： Hiroki TAGATO ,  Yoshiaki SAKAE ,  Takashi KONASHI ,  Jun NISHIOKA ,  Yuji KOBAYASHI ,  Jun KODAMA ,  Etsuko ICHIHARA

    IPC: B23K9/095 ,  B23K31/12

    Abstract: In order to attain an object of providing a technique to, upon detection of an abnormality in a welded part, provide notification of a factor of the detected abnormality, an abnormality diagnosis apparatus includes: an acquisition means (21) for acquiring time series data containing at least one of an electric current value and a voltage value at first welding; an abnormality determination means (22) for determining, with use of an abnormality determination model and based on the time series data acquired by the acquisition means, whether or not there is an abnormality in a welded part at the first welding; and an output means (23) for, if the abnormality determination means has determined that there is an abnormality, outputting the determination result and at least one of a factor of the abnormality and a remedial method for solving the abnormality.

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