公开(公告)号：US11355457B2

公开(公告)日：2022-06-07

申请号：US16445650

申请日：2019-06-19

Applicant: NXP B.V.

Inventor： Andreas Lentz ,  Stefan Heyse ,  Martin Heinrich Butkus ,  Oliver Alexander Schmidt

IPC: H01L23/00 ,  H03K19/20 ,  H03K3/037 ,  H03K5/00 ,  G06F21/55 ,  H03K3/011

Abstract: A fully digital method and apparatus are provided for detecting glitches on a monitored line by providing a toggle signal to an initial delay circuit and a plurality of delay elements formed with standard logic cells so that logic values from the delay elements are captured in a corresponding plurality of clocked capture flops to provide a digitized representation of a delay value during a sampling period which is converted to a numerical measurement result which is evaluated against a reference value to generate an output error signal if a difference between the numerical measurement result and reference value exceeds a programmable margin, where the initial delay circuit is configured with a trim setting to impose an initial delay to compensate for process variations and where the reference value is adapted over a plurality of sampling periods to compensate for temperature effects on the numerical measurement result.