METHOD AND APPARATUS OF PROFILE MEASUREMENT
    3.
    发明申请
    METHOD AND APPARATUS OF PROFILE MEASUREMENT 审中-公开
    配置文件测量的方法和装置

    公开(公告)号:US20140152771A1

    公开(公告)日:2014-06-05

    申请号:US14091970

    申请日:2013-11-27

    Inventor: Tzyy-Shuh Chang

    CPC classification number: G01B11/24 G01B11/25 G03B35/02 H04N13/239 H04N13/254

    Abstract: A system and method for profile measurement based on triangulation involves arrangement of an image acquisition assembly relative to an illumination assembly such that an imaging plane is parallel to a light plane (measurement plane defined by where the light plane impinges on the object), which supports uniform pixel resolution in the imaging plane. The image acquisition assembly includes an imaging sensor having a sensor axis and a lens having a principal axis, wherein the lens axis is offset from the imaging axis.

    Abstract translation: 用于基于三角测量的轮廓测量的系统和方法涉及相对于照明组件布置图像获取组件,使得成像平面平行于由平面所在的物体所在的光平面所影响的光平面(测量平面),其支撑 在成像平面中的均匀像素分辨率。 图像采集组件包括具有传感器轴和具有主轴的透镜的成像传感器,其中透镜轴偏离成像轴。

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