公开(公告)号：US20190170577A1

公开(公告)日：2019-06-06

申请号：US16271608

申请日：2019-02-08

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Yoshihiro OSAWA ,  Tsutomu MIZUGUCHI ,  Munehiro NOGUCHI

IPC: G01J3/28 ,  G01J3/18 ,  G01N21/27 ,  G01J3/02 ,  G01N21/64 ,  G01N21/35 ,  G01N21/33

CPC classification number: G01J3/28 ,  G01J3/0218 ,  G01J3/0251 ,  G01J3/0254 ,  G01J3/0286 ,  G01J3/18 ,  G01N21/0332 ,  G01N21/274 ,  G01N21/33 ,  G01N21/35 ,  G01N21/645 ,  G01N2201/1211

Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

公开(公告)号：US20170010214A1

公开(公告)日：2017-01-12

申请号：US15200535

申请日：2016-07-01

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Yoshihiro OSAWA ,  Tsutomu MIZUGUCHI ,  Munehiro NOGUCHI

IPC: G01N21/64

CPC classification number: G01J3/28 ,  G01J3/0218 ,  G01J3/0251 ,  G01J3/0254 ,  G01J3/0286 ,  G01J3/18 ,  G01N21/0332 ,  G01N21/274 ,  G01N21/33 ,  G01N21/35 ,  G01N21/645 ,  G01N2201/1211

Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

Abstract translation: 提供了可以在相当短的时间内设置并且可以提高检测灵敏度的光学特性测量系统。 光学特性测量系统包括第一测量装置。 第一测量装置包括：布置在壳体中的第一检测元件; 至少部分地接合到冷却检测元件的第一检测元件的第一冷却单元; 以及抑制壳体内的检测元件周围发生的温度变化的抑制机构。

公开(公告)号：US20190170578A1

公开(公告)日：2019-06-06

申请号：US16271621

申请日：2019-02-08

Applicant: Otsuka Electronics Co., Ltd.

Inventor： Yoshihiro OSAWA ,  Tsutomu MIZUGUCHI ,  Munehiro NOGUCHI

IPC: G01J3/28 ,  G01J3/18 ,  G01N21/27 ,  G01J3/02 ,  G01N21/64 ,  G01N21/35 ,  G01N21/33

CPC classification number: G01J3/28 ,  G01J3/0218 ,  G01J3/0251 ,  G01J3/0254 ,  G01J3/0286 ,  G01J3/18 ,  G01N21/0332 ,  G01N21/274 ,  G01N21/33 ,  G01N21/35 ,  G01N21/645 ,  G01N2201/1211

Abstract: There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.