System and method for determining successive single molecular decay

    公开(公告)号:US12050130B2

    公开(公告)日:2024-07-30

    申请号:US18542717

    申请日:2023-12-17

    CPC classification number: G01J3/4406 G01J3/0218 G01J3/0227

    Abstract: A measurement system is disclosed which includes a vessel configured to suspend molecules of interest therein, optical sources configured to excite the molecules of interest by an excitation light activated and deactivated in a stepwise fashion, during the activation, the sources activated according to a pulse train, the molecules of interest emitting emission light in response to being excited by the excitation light, one or more sensor packages each comprising a plurality of photodetectors configured to receive emission light from the molecules of interest and, in response, provide an output voltage signal and an output current signal corresponding to photoelectron response of an incident photon on the one or more sensor packages, and a detector configured to determine successive single molecular decay of the molecules of interest, generate an emission pulse associated with each incident photon on the one or more sensor packages, and count the number of emission pulses.

    Optical MEMS based monitoring system

    公开(公告)号:US11999612B2

    公开(公告)日:2024-06-04

    申请号:US17525950

    申请日:2021-11-14

    Applicant: Naiqian Han

    Inventor: Naiqian Han

    Abstract: Provided is an optical micro-electro-mechanical system (MEMS) based monitoring system, comprising: a broadband light source, a tunable optical filter (TOF), an optical etalon, a plurality of optical receivers, a plurality of optical couplers, and a plurality of optical MEM sensors; the TOF is configured to capture a transmission, reflection or interference spectrum of the optical MEMS sensors; wherein the peak or depression wavelength in the transmission, reflection or interference spectrum corresponds to a parameter of the pressure, temperature or stress, and the peak or depression wavelength can be obtained by comparing the spectrum with the periodic spectrum of the optical etalon, the optical etalon has an absolute wavelength mark; and the optical MEMS sensor comprises an optical MEMS resonator. The parameter of the pressure, temperature or stress can be obtained by the peak or depression wavelength in the transmission, the reflection or the interference spectrum of the optical MEMS sensor.

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