Patent search ap:("PHILIPS LAB INC") AND inv:"GEORGE FIRTH FRANCIS" Page 1

$Stress analysis by x-ray diffraction$

1.

发明授权
Stress analysis by x-ray diffraction 失效
Title translation: 通过X射线衍射进行应力分析

公开(公告)号：US2462374A

公开(公告)日：1949-02-22

申请号：US55716344

申请日：1944-10-04

Applicant: PHILIPS LAB INC

Inventor： GEORGE FIRTH FRANCIS

IPC: G01N23/207

CPC classification number: G01N23/207

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