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公开(公告)号：US20210264026A1
公开(公告)日：2021-08-26
申请号：US16973898
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G06F21/55
Abstract: An unauthorized communication detection device that detects unauthorized communication in a manufacturing system that manufactures products includes: an obtainer that obtains operation information of the manufacturing system; a storage that stores element information indicating one or more target elements among a plurality of elements related to manufacturing of the products; a specifier that specifies, for each of a plurality of communications performed in the manufacturing system, an element corresponding to the communication, based on the operation information; a calculator that calculates an abnormal degree of each of one or more communications, which satisfy that the element specified by the specifier is included in the one or more target elements indicated by the element information, among the plurality of communications; and a determiner that determines that, when an abnormal degree calculated by the calculator is larger than a threshold value, a communication corresponding to the abnormal degree is the unauthorized communication.
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公开(公告)号：US20210308782A1
公开(公告)日：2021-10-07
申请号：US17353108
申请日：2021-06-21
Inventor： Michio SAKURAI , Narumi ATSUTA , Toru SAKAI , Masashi YOSHIDA
Abstract: A welding system includes a welding apparatus and an appearance inspection apparatus. The appearance inspection apparatus includes: a shape measurement unit that measures the shape of a weld; an image processor that generates image data based on data of the shape; a determination unit that determines whether the shape of the weld is good or bad based on the image data and a determination model; and a feedback unit that extracts shape defect information if the result of the determination by the determination unit is negative. An output controller of the welding apparatus corrects a welding condition for a workpiece based on the shape defect information extracted by the feedback unit.
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公开(公告)号：US20210208578A1
公开(公告)日：2021-07-08
申请号：US16973917
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G05B23/02 , G05B19/418
Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold value.
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