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Patent Agency Ranking
公开(公告)号：US20150115440A1
公开(公告)日：2015-04-30
申请号：US14592576
申请日：2015-01-08
Inventor： Yuichi HIGUCHI
IPC: H01L25/065 , H01L23/48 , H01L23/00
CPC classification number: H01L25/0657 , H01L21/563 , H01L23/481 , H01L24/02 , H01L24/03 , H01L24/05 , H01L24/11 , H01L24/13 , H01L24/16 , H01L24/17 , H01L24/32 , H01L24/81 , H01L24/83 , H01L2224/02372 , H01L2224/0239 , H01L2224/0345 , H01L2224/03462 , H01L2224/03614 , H01L2224/03912 , H01L2224/03914 , H01L2224/0401 , H01L2224/05011 , H01L2224/05012 , H01L2224/05015 , H01L2224/05073 , H01L2224/05082 , H01L2224/05124 , H01L2224/05166 , H01L2224/05187 , H01L2224/05551 , H01L2224/05552 , H01L2224/05555 , H01L2224/05557 , H01L2224/05558 , H01L2224/05559 , H01L2224/05572 , H01L2224/05573 , H01L2224/05582 , H01L2224/05609 , H01L2224/05611 , H01L2224/05613 , H01L2224/05617 , H01L2224/05618 , H01L2224/05624 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/05657 , H01L2224/05666 , H01L2224/05684 , H01L2224/1145 , H01L2224/11462 , H01L2224/13014 , H01L2224/13017 , H01L2224/13019 , H01L2224/13022 , H01L2224/13024 , H01L2224/13025 , H01L2224/1308 , H01L2224/13082 , H01L2224/13083 , H01L2224/131 , H01L2224/13109 , H01L2224/13111 , H01L2224/13113 , H01L2224/13117 , H01L2224/13118 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13157 , H01L2224/13166 , H01L2224/13184 , H01L2224/16014 , H01L2224/16058 , H01L2224/16148 , H01L2224/16237 , H01L2224/32145 , H01L2224/73104 , H01L2224/73204 , H01L2224/8112 , H01L2224/81121 , H01L2224/8114 , H01L2224/81141 , H01L2224/81143 , H01L2224/81193 , H01L2224/81201 , H01L2224/83862 , H01L2224/92125 , H01L2225/06513 , H01L2225/06541 , H01L2225/06548 , H01L2225/06593 , H01L2924/01032 , H01L2924/207 , H01L2924/2075 , H01L2924/20751 , H01L2924/20752 , H01L2924/20753 , H01L2924/20754 , H01L2924/20755 , H01L2924/381 , H01L2924/384 , H01L2224/16225 , H01L2224/32225 , H01L2924/00012 , H01L2924/00014 , H01L2924/04953 , H01L2924/014 , H01L2924/01022 , H01L2924/01029
Abstract: A semiconductor device includes multilayer chips in which a first semiconductor chip and a second semiconductor chip are bonded together. A first electrode pad is formed on a principal surface of the first semiconductor chip, and a first bump is formed on the first electrode pad. A second bump is formed on the principal surface of the second semiconductor chip such that the second bump is bonded to the first bump. The first electrode pad has an opening, and the opening and an entire peripheral portion of the opening form a stepped shape form a stepped shape. The first bump has a recessed shape that is recessed at a center thereof and covers the stepped shape.
Abstract translation: 半导体器件包括其中第一半导体芯片和第二半导体芯片结合在一起的多层芯片。 第一电极焊盘形成在第一半导体芯片的主表面上，并且在第一电极焊盘上形成第一突起。 在第二半导体芯片的主表面上形成第二凸起，使得第二凸块与第一凸块接合。 第一电极焊盘具有开口，并且开口和形成台阶状的开口的整个周边部分形成阶梯形状。 第一凸块具有在其中心凹陷并且覆盖阶梯形状的凹陷形状。
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公开(公告)号：US20210264026A1
公开(公告)日：2021-08-26
申请号：US16973898
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G06F21/55
Abstract: An unauthorized communication detection device that detects unauthorized communication in a manufacturing system that manufactures products includes: an obtainer that obtains operation information of the manufacturing system; a storage that stores element information indicating one or more target elements among a plurality of elements related to manufacturing of the products; a specifier that specifies, for each of a plurality of communications performed in the manufacturing system, an element corresponding to the communication, based on the operation information; a calculator that calculates an abnormal degree of each of one or more communications, which satisfy that the element specified by the specifier is included in the one or more target elements indicated by the element information, among the plurality of communications; and a determiner that determines that, when an abnormal degree calculated by the calculator is larger than a threshold value, a communication corresponding to the abnormal degree is the unauthorized communication.
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公开(公告)号：US20200021610A1
公开(公告)日：2020-01-16
申请号：US16580853
申请日：2019-09-24
Inventor： Hiroshi AMANO , Yosuke TAJIKA , Yuichi HIGUCHI
Abstract: An abnormality in a manufacturing system is detected without extensive modification to the existing manufacturing systems. The data analysis device includes: a receiver configured to receive a packet transmitted between a manufacture control device and a manufacturing device; an analyzer configured to obtain the type of data included in a payload of the received packet from an IP address and a port number included in a header of the packet; a selector configured to select, based on the type of the data obtained by the analyzer, a syntax or rule corresponding to the type of the data; and a determiner configured to determine that the manufacturing system has an abnormality if the data included in the payload does not follow the syntax or rule corresponding to the type of the data.
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公开(公告)号：US20210208578A1
公开(公告)日：2021-07-08
申请号：US16973917
申请日：2019-06-07
Inventor： Hiroshi AMANO , Narumi ATSUTA , Noriaki HAMADA , Yosuke TAJIKA , Nobutaka KAWAGUCHI , Yuichi HIGUCHI , Taichi SHIMIZU
IPC: G05B23/02 , G05B19/418
Abstract: An abnormality analysis device including: an overall information obtainer that obtains overall information indicating an overall feature amount of a manufacturing system; an overall abnormal degree calculator that calculates an overall abnormal degree that is an abnormal degree of a whole of the manufacturing system by statistically processing the overall information; an individual information obtainer that obtains individual information indicating a feature amount of each of the plurality of constituent elements; an individual abnormal degree calculator that calculates an individual abnormal degree that is an abnormal degree of each of the plurality of constituent elements by statistically processing the individual information; and a determiner that determines whether or not the overall abnormal degree exceeds a threshold value, wherein the individual abnormal degree calculator calculates the individual abnormal degree when the determiner determines that the overall abnormal degree exceeds the threshold value.
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5.发明申请公开(公告)号：US20190213291A1
公开(公告)日：2019-07-11
申请号：US16331572
申请日：2017-10-26
Inventor： Yuichi HIGUCHI , Takeshi ISHIKAWA
CPC classification number: G06F17/5009 , B65G1/137 , G06F2217/38 , G06Q10/04 , G06Q10/067 , G06Q10/08 , G06Q50/28 , G16Z99/00
Abstract: An article-storage simulation device includes an acquisition unit that acquires a size of each of the plurality of articles and a size of the storage container. A simulator determines the number of storage containers to be used for storing the articles and a number of articles to be stored by calculation. The calculation uses the acquired size of the articles and the acquired size of the container. The simulator (i) places the article in the container, (ii) determines whether a next article can be placed in the container after the article is placed, and (iii) in a case where the simulator determines that the next article can be placed, places the next article in the container after the article is placed and in a case where the simulator determines that the next article cannot be placed, adds a next container to be used for storing the next article.
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