公开(公告)号：US12034476B2

公开(公告)日：2024-07-09

申请号：US17559659

申请日：2021-12-22

Applicant: Panduit Corp.

Inventor： Jose M. Castro ,  Richard J. Pimpinella ,  Bulent Kose ,  Yu Huang ,  Fei Jia

IPC: H04B10/077 ,  H04B10/071 ,  H04B10/073 ,  H04B10/2581

CPC classification number: H04B10/0775 ,  H04B10/071 ,  H04B10/073 ,  H04B10/2581

Abstract: A test apparatus has at least one optical source, a high-speed photodetector, a microcontroller or processor, and electrical circuitry to power and drive the at least one optical source, photodetector, and microcontroller or processor and for measuring the frequency response of a multimode optical fiber under test. The test apparatus can utilize an optical pulse waveform with a light adapter to measure of the channel under test. It can also uses a correction method to de-embed a chromatic bandwidth of the source from the encircled flux modal chromatic bandwidth. The correction method can use correction functions obtained for different type of VCSELs to estimate the optical channel bandwith when used with VCSEL transceivers.

公开(公告)号：US20220271834A1

公开(公告)日：2022-08-25

申请号：US17559659

申请日：2021-12-22

Applicant: Panduit Corp.

Inventor： Jose M. Castro ,  Richard J. Pimpinella ,  Bulent Kose ,  Yu Huang ,  Fei Jia

IPC: H04B10/077

Abstract: A test apparatus has at least one optical source, a high-speed photodetector, a microcontroller or processor, and electrical circuitry to power and drive the at least one optical source, photodetector, and microcontroller or processor and for measuring the frequency response of a multimode optical fiber under test. The test apparatus can utilize an optical pulse waveform with a light adapter to measure of the channel under test. It can also uses a correction method to de-embeed a chromatic bandwidth of the source from the encircled flux modal chromatic bandwidth. The correction method can use correction functions obtained for different type of VCSELs to estimate the optical channel bandwidth when used with VCSEL transceivers.