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公开(公告)号：US10041971B2
公开(公告)日：2018-08-07
申请号：US14423123
申请日：2013-08-20
IPC分类号： G01Q70/14 , G01N21/64 , G01N24/10 , G01Q60/38 , G01Q60/54 , G01R33/022 , G01R33/032 , G01R33/12 , G01R33/60 , G01Q30/02 , G01Q60/08 , G01R33/32
摘要： A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.
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公开(公告)号：US20150253355A1
公开(公告)日：2015-09-10
申请号：US14423123
申请日：2013-08-20
CPC分类号： G01Q70/14 , G01N21/645 , G01N24/10 , G01N2201/10 , G01Q30/025 , G01Q60/08 , G01Q60/38 , G01Q60/54 , G01R33/022 , G01R33/032 , G01R33/1284 , G01R33/323 , G01R33/60
摘要： A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.
摘要翻译： 感测探针可以由金刚石材料形成，该金刚石材料包括配置成发射荧光的一个或多个自旋缺陷，并且距离感测探针的感测表面不超过50nm。 感测探头可以包括由金刚石材料形成并被配置为将荧光光导向光输出耦合结构的输出端的光输出耦合结构。 光学检测器可以检测从旋转缺陷发出的荧光，并且在光学引导通过其后从光学输出耦合结构的输出端射出。 安装系统可以保持感测探头并且控制感测探头的感测表面与样本表面之间的距离，同时允许感测表面和样品表面之间的相对运动。
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公开(公告)号：US11815528B2
公开(公告)日：2023-11-14
申请号：US17675156
申请日：2022-02-18
IPC分类号： G01Q70/14 , G01N24/10 , G01R33/032 , G01Q60/54 , G01R33/12 , G01R33/60 , G01R33/022 , G01N21/64 , G01Q60/38 , G01Q30/02 , G01Q60/08 , G01R33/32
CPC分类号： G01Q70/14 , G01N21/645 , G01N24/10 , G01Q60/38 , G01Q60/54 , G01R33/022 , G01R33/032 , G01R33/1284 , G01R33/60 , G01N2201/10 , G01Q30/025 , G01Q60/08 , G01R33/323
摘要： A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.
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