HANDLER BASED AUTOMATED TESTING OF INTEGRATED CIRCUITS IN AN ELECTRONIC DEVICE
    1.
    发明申请
    HANDLER BASED AUTOMATED TESTING OF INTEGRATED CIRCUITS IN AN ELECTRONIC DEVICE 审中-公开
    电子设备中基于处理器的自动测试集成电路

    公开(公告)号:US20170023643A1

    公开(公告)日:2017-01-26

    申请号:US14836851

    申请日:2015-08-26

    Abstract: A method and apparatus for testing electronic devices installed in a portable device. The apparatus incorporates a socket with receptacles for alignment pins, and an alignment plate with openings for the alignment pins. The holes for the alignment pins are matched to the socket receptacles, providing secure alignment. The spring loaded socket pin mates with at least one solder ball. The apparatus also includes a circuit card, which may be a modem test platform circuit card that has contacts that mate with the at least one solder ball. Other functions may be tested using other circuit card assemblies. A method of testing includes: installing the electronic device to be tested into a socket assembly, aligning the electronic device to be tested into the socket assembly; installing the socket assembly into a test apparatus, and testing the device.

    Abstract translation: 一种用于测试安装在便携式设备中的电子设备的方法和设备。 该装置包括具有用于对准销的插座的插座和具有用于对准销的开口的对准板。 对准销的孔与插座插座相匹配,提供牢固的对准。 弹簧加载的插座针与至少一个焊球匹配。 该装置还包括电路卡,其可以是具有与至少一个焊球匹配的触点的调制解调器测试平台电路卡。 其他功能可以使用其他电路卡组件进行测试。 测试方法包括:将要测试的电子设备安装到插座组件中,将要测试的电子设备对准插座组件; 将插座组件安装到测试设备中,并测试设备。

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