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公开(公告)号:US20180113031A1
公开(公告)日:2018-04-26
申请号:US15433872
申请日:2017-02-15
Applicant: Quanta Computer Inc.
Inventor: Chun-Jie YU , Cheng-Te YANG
IPC: G01K13/00
Abstract: A method for monitoring temperature of an electronic element is provided. The method is used in an embedded controller of a device and includes: determining whether the temperature reading is higher than or equal to a temperature threshold; increasing a time value of a timer with an accumulated time value when the temperature reading is higher than or equal to the temperature threshold; determining whether the time value is greater than or equal to a time threshold; and transmitting a notification signal to a basic input/output system (BIOS) to notify the BIOS to read the temperature reading when the time value is greater than or equal to the time threshold.