METHOD AND DEVICE FOR MONITORING TEMPERATURE OF AN ELECTRONIC ELEMENT

    公开(公告)号:US20180113031A1

    公开(公告)日:2018-04-26

    申请号:US15433872

    申请日:2017-02-15

    CPC classification number: G01K13/00 G01K1/02

    Abstract: A method for monitoring temperature of an electronic element is provided. The method is used in an embedded controller of a device and includes: determining whether the temperature reading is higher than or equal to a temperature threshold; increasing a time value of a timer with an accumulated time value when the temperature reading is higher than or equal to the temperature threshold; determining whether the time value is greater than or equal to a time threshold; and transmitting a notification signal to a basic input/output system (BIOS) to notify the BIOS to read the temperature reading when the time value is greater than or equal to the time threshold.

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