公开(公告)号：US20170261305A1

公开(公告)日：2017-09-14

申请号：US15605377

申请日：2017-05-25

Applicant: RENISHAW PLC

Inventor： John OULD ,  Kevin TETT

IPC: G01B7/012 ,  G01B21/04

CPC classification number: G01B7/012 ,  G01B21/045

Abstract: A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.