公开(公告)号：US20170261305A1

公开(公告)日：2017-09-14

申请号：US15605377

申请日：2017-05-25

Applicant: RENISHAW PLC

Inventor： John OULD ,  Kevin TETT

IPC: G01B7/012 ,  G01B21/04

CPC classification number: G01B7/012 ,  G01B21/045

Abstract: A method of finding a feature of an object using an analogue probe mounted on a machine tool. The method includes the analogue probe and/or object following a course of motion which causes the analogue probe's surface sensing region to traverse across the feature to be found a plurality of times whilst approaching the feature over successive traverses so as to ultimately arrive in a position sensing relationship with the feature so as to collect scanned measurement data about the feature along at least part of a traverse.

公开(公告)号：US20180364676A1

公开(公告)日：2018-12-20

申请号：US16008415

申请日：2018-06-14

Applicant: RENISHAW PLC

Inventor： Michael WOOLDRIDGE ,  Paul MOORE ,  John OULD

IPC: G05B19/401 ,  G01B21/04

Abstract: A method of scanning an object using an analogue probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analogue probe having a preferred measurement range. The method includes controlling the analogue probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analogue probe will be caused to obtain data within its preferred measuring range, as well as cause the analogue probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.

公开(公告)号：US20150377617A1

公开(公告)日：2015-12-31

申请号：US14765188

申请日：2014-02-03

Applicant: RENISHAW PLC

Inventor： John OULD

IPC: G01B21/04

CPC classification number: G01B21/04 ,  G01B5/10 ,  G01B5/201 ,  G01B5/213 ,  G05B19/401 ,  G05B2219/37043

Abstract: A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path.

Abstract translation: 一种用于测量安装在坐标定位机上的接触探针的部件的方法和装置。 该方法包括当部件和接触探头在坐标定位机内的不同位置之间连续移动时，测量该部件上的多个点。 探针相对于部件沿着扫描路径移动，使得沿着被测量的曲线或表面紧密地位于一起的基本上重合的点在机器的相对较远的位置处以及沿着扫描路径的相对较远的位置处被测量 。