公开(公告)号：US20130164175A1

公开(公告)日：2013-06-27

申请号：US13728329

申请日：2012-12-27

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hong Geun KIM ,  Dong Young KIM ,  Chung Ung KIM

IPC: G01N35/10

CPC classification number: G01N35/1081 ,  G01N35/00069

Abstract: A sample analysis apparatus is provided with a structure for stopping rotation of a disc at a precise position. The sample analysis apparatus includes a disc configured to rotate on a rotation shaft and having at least one detection zone, an optical sensing apparatus configured to detect a reaction result at the at least one detection zone, at least one position determining protrusion provided on an exterior surface of the disc, a slider movably disposed to in a radial direction relative to the disc, and a stopper mounted to the slider and configured to stop rotation of the disc by blocking the at least one position determining protrusion.

Abstract translation: 样品分析装置具有用于停止在精确位置的盘的旋转的结构。 样品分析装置包括被配置为在旋转轴上旋转并且具有至少一个检测区域的光盘，被配置为检测所述至少一个检测区域上的反应结果的光学感测设备，设置在外部的至少一个位置确定突起 盘的表面，相对于盘可径向移动地设置的滑块，以及安装到滑块上并被配置为通过阻挡至少一个位置确定突起来停止盘旋转的止动件。