公开(公告)号：US20220402019A1

公开(公告)日：2022-12-22

申请号：US17837487

申请日：2022-06-10

Applicant: SINTOKOGIO, LTD.

Inventor： Yuichi OGURA ,  Shigeyoshi KATO ,  Yoshimitsu ICHINO

IPC: B22C5/16 ,  B65G17/12

Abstract: A molding sand supply device according to one aspect includes a sampling tool to sample molding sand, and a conveying device to convey the molding sand sampled by the sampling tool to a supply position along a bent conveyance path.

公开(公告)号：US20210053108A1

公开(公告)日：2021-02-25

申请号：US16965871

申请日：2018-11-15

Applicant: Sintokogio, Ltd.

Inventor： Takashi HANAI ,  Takehiro SUGINO ,  Kazunori OGURA ,  Yoshimitsu ICHINO ,  Shuji TAKASU

IPC: B22C19/04 ,  B22C21/10 ,  B22D46/00 ,  B22D47/02

Abstract: A method is provided for measuring a shift between a carrier for a pattern (a carrier plate) and a flask and preventing a defect caused by a shift in the cavity parts. The method for preventing a defect caused by the shift in the cavity parts in molding a cope and a drag with flasks by using a cope flask (110) that is assembled with a carrier plate (130) for the cope flask and a drag flask (120) that is assembled with a carrier plate (140) for the drag flask, comprises the steps of measuring a shift between the carrier plate (130) for the cope flask and the cope flask (110), measuring a shift between the carrier plate (140) for the drag flask and the drag flask (120), measuring a shift between the cope flask (110) and the drag flask (120) that have been assembled, determining if a shift in cavity parts is within an allowable range, wherein the data on the shift is obtained based on the shift between the carrier plate (130) for the cope flask and the cope flask (110), the shift between the carrier plate (140) for the drag flask and the drag flask (120), and the shift between the cope flask (110) and the drag flask (120, that have been assembled.

公开(公告)号：US20200234419A1

公开(公告)日：2020-07-23

申请号：US16486907

申请日：2018-05-10

Applicant: SINTOKOGIO, LTD.

Inventor： Kazuhiro OTA ,  Tsutomu SEKI ,  Yoshimitsu ICHINO ,  Junichi IWASAKI ,  Takeshi SONOHARA ,  Ryuichi KAWAKAMI ,  Tatsuya AOKI

IPC: G06T7/00 ,  G06K9/20 ,  G01N21/90 ,  B22C19/04 ,  B22D37/00

Abstract: An inspection device is a device that inspects the appearance of a target, including: an imaging device configured to image the target from a first direction; an illuminating unit configured to apply light to the target; and a controller configured to acquire a first inspection image by causing the imaging device to image the target to which light is applied from a first position, to acquire a second inspection image by causing the imaging device to image the target to which light is applied from a second position, and to inspect an appearance of the target based on the first inspection image, the second inspection image, and a reference image. The first position and the second position overlap each other when viewed from the first direction.