Device for determining the mask version utilized for each metal layer of an integrated circuit
    1.
    发明申请
    Device for determining the mask version utilized for each metal layer of an integrated circuit 有权
    用于确定用于集成电路的每个金属层的掩模版本的装置

    公开(公告)号:US20040143805A1

    公开(公告)日:2004-07-22

    申请号:US10699613

    申请日:2003-10-30

    Inventor: Arnaud Deleule

    Abstract: A device for determining the version of metal mask utilized for producing a given metal layer (Metal3) in an integrated circuit including a plurality of metal layers (Meta0, . . . , Metal3), and any modification made to the given metal layer (Metal3) requiring generation of a new version of the corresponding metal mask. The device includes a cell (Cell) integrated into the metal layer (Metal3) including at least a first voltage source (Vdd) for supplying a first voltage level, at least a second voltage source (GND) for supplying a second voltage level, and an output bus composed of at least one conductor wire (S1, S2) connected selectively to one of the first and second voltage sources as a function of the version of metal mask used to produce the metal layer, so as to generate a binary output signal representative of the mask version utilized.

    Abstract translation: 一种用于确定用于在包括多个金属层(Meta0,...,Metal3)的集成电路中制造给定金属层(Metal3)的金属掩膜版本的装置,以及对给定金属层(Metal3 )需要产生相应金属掩模的新版本。 该装置包括集成到金属层(Metal3)中的单元(Cell),其包括用于提供第一电压电平的至少第一电压源(Vdd),用于提供第二电压电平的至少第二电压源(GND);以及 一个输出总线,其由至少一个导体线(S1,S2)组成,该导体线选择性地连接到第一和第二电压源中的一个,作为用于产生金属层的金属掩模的形式的函数,以便产生二进制输出信号 代表使用的掩模版本。

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