Abstract:
In accordance with an embodiment, a method of measuring a load current flowing through a current measurement resistor coupled between a source node and a load node includes: measuring a first voltage across a replica resistor when a first end of the replica resistor is coupled to the source node and a second end of the replica resistor is coupled to a reference current source; measuring a second voltage across the replica resistor when the second end of the replica resistor is coupled to the source node and the first end of the replica resistor is coupled to the reference current source; measure a third voltage across the current sensing resistor; and calculating a corrected current measurement of the load current based on the measured first voltage, the measured second voltage and the measured third voltage.
Abstract:
In accordance with an embodiment, a method of measuring a load current flowing through a current measurement resistor coupled between a source node and a load node includes: measuring a first voltage across a replica resistor when a first end of the replica resistor is coupled to the source node and a second end of the replica resistor is coupled to a reference current source; measuring a second voltage across the replica resistor when the second end of the replica resistor is coupled to the source node and the first end of the replica resistor is coupled to the reference current source; measure a third voltage across the current sensing resistor; and calculating a corrected current measurement of the load current based on the measured first voltage, the measured second voltage and the measured third voltage.
Abstract:
A sensor comprises a first transistor comprising a first control terminal, a second transistor that is a scaled version of and connected to the first transistor and comprising a second control terminal, an operational amplifier connected to both the first and second transistors and configured to generate an intermediate signal at an output terminal, a variable current source, a current mirror, a measurement circuit, and a chopper circuit. The first and second control terminals are configured to receive a drive signal. The variable current source is configured to generate a first variable current as a function of the intermediate signal. The current mirror configured to apply a second variable current proportional to the first variable current to the second transistor. The measurement circuit is configured to generate a measurement signal indicative of current through the first transistor. The chopper circuit is configured to shift an offset of the operation amplifier.
Abstract:
Capacitance sensing circuits and methods are provided. The capacitance sensing circuit includes a capacitance-to-voltage converter configured to receive a signal from a capacitance to be sensed and to provide an output signal representative of the capacitance, an output chopper configured to convert the output signal of the capacitance-to-voltage converter to a sensed voltage representative of the capacitance to be sensed, an analog accumulator configured to accumulate sensed voltages during an accumulation period of NA sensing cycles and to provide an accumulated analog value, an amplifier configured to amplify the accumulated analog value, and an analog-to-digital converter configured to convert the amplified accumulated analog value to a digital value representative of the capacitance to be sensed. The analog accumulator may include a low pass filter having a frequency response to filter wideband noise.
Abstract:
Accumulators that operate to fully or partially remove noise from a signal, including removing noise inserted into the signal by the accumulator itself. In some embodiments, an accumulator may be operated in a sampling phase and a transfer phase each time the accumulator samples an input signal. In some such embodiments, an op-amp of an accumulation circuit of the accumulator may be auto-zeroed during some or all of the sampling phases of an accumulation period. In some embodiments in which the op-amp is auto-zeroed during some or all of the sampling phases, the accumulation circuit may include a holding capacitor that, during an auto-zeroing process, holds a value output by the op-amp during a prior transfer phase. Including such a holding capacitor in an accumulator may reduce a voltage that the op-amp output rises following the auto-zero process, which may reduce a bandwidth and noise of the accumulation circuit.
Abstract:
A differential current conveyor circuit includes two or more single-ended current conveyor stages and a common bias stage. First and second switches are set between the control terminals of the transistors in the common bias stage and a respective one of a first and a second coupling line of the single ended stages can be switched between the following: a reset state of the circuit with the transistors in the common bias stage coupled to the first and second coupling lines with the single-ended stages set to a bias condition; and a sensing state of the circuit with the transistors in the common bias stage decoupled from the first and second coupling lines, with the single-ended stages in a high impedance state with the control terminals of the input transistors of the single ended stages capacitively coupled to the input terminal.
Abstract:
Accumulators that operate to fully or partially remove noise from a signal, including removing noise inserted into the signal by the accumulator itself. In some embodiments, an accumulator may be operated in a sampling phase and a transfer phase each time the accumulator samples an input signal. In some such embodiments, an op-amp of an accumulation circuit of the accumulator may be auto-zeroed during some or all of the sampling phases of an accumulation period. In some embodiments in which the op-amp is auto-zeroed during some or all of the sampling phases, the accumulation circuit may include a holding capacitor that, during an auto-zeroing process, holds a value output by the op-amp during a prior transfer phase. Including such a holding capacitor in an accumulator may reduce a voltage that the op-amp output rises following the auto-zero process, which may reduce a bandwidth and noise of the accumulation circuit.
Abstract:
A band-pass filter made up by an operational amplifier and by an input circuit. The input circuit is formed by a capacitive filtering element, connected to the input of the operational amplifier; a coupling switch, coupled between an input node and the capacitive filtering element; a capacitive sampling element, coupled between the input of the filter and the input node; and a sampling switch, coupled between the input node and a reference-potential line. The coupling switch and the input sampling switch close in phase opposition according to a succession of undesired components sampling and sensing steps, so that the capacitive sampling element forms a sampler for sampling the undesired component in the undesired components sampling step, in the absence of the component of interest, and forms a subtractor of the undesired components from the input signal in the sensing step.
Abstract:
Capacitance sensing circuits and methods are provided. A dual mode capacitance sensing circuit includes a capacitance-to-voltage converter having an amplifier and an integration capacitance coupled between an output and an inverting input of the amplifier, and a dual mode switching circuit responsive to mutual mode control signals for a controlling signal supplied from a capacitive touch matrix to the capacitance-to-voltage converter in a mutual capacitance sensing mode and responsive to self mode control signals for controlling signals supplied from the capacitive touch matrix to the capacitance-to-voltage converter in a self capacitance sensing mode, wherein the capacitance sensing circuit is configurable for operation in the mutual capacitance sensing mode or the self capacitance sensing mode.
Abstract:
Hall sensing signals are received in a spinning readout pattern of subsequent readout phases, wherein the pattern is cyclically repeated at a spinning frequency and a polarity of the Hall sensor signals is reversed in two non-adjacent readout phases of the readout pattern. A signal storage circuit includes signal storage capacitors. An accumulation circuit includes accumulation capacitors. A switch network is selectively actuated to couple the signal storage capacitors with the accumulation capacitors synchronously with phases in the spinning readout pattern in subsequent alternating first and second periods. The spinning output is stored with alternating opposite signs on the signal storage capacitors and the Hall sensing signals are stored in the signal storage capacitors and then accumulated on the accumulation capacitors with alternate signs in subsequent periods. The accumulated output signal is then demodulated with a demodulation frequency half the spinning frequency.