METHOD FOR AUTHENTICATION OF AN OBJECT BY A DEVICE CAPABLE OF MUTUAL CONTACTLESS COMMUNICATION, CORRESPONDING SYSTEM AND OBJECT
    3.
    发明申请
    METHOD FOR AUTHENTICATION OF AN OBJECT BY A DEVICE CAPABLE OF MUTUAL CONTACTLESS COMMUNICATION, CORRESPONDING SYSTEM AND OBJECT 审中-公开
    通过相互联系通信的设备验证对象的方法,相应的系统和对象

    公开(公告)号:US20160226665A1

    公开(公告)日:2016-08-04

    申请号:US14929566

    申请日:2015-11-02

    Inventor: Sylvie WUIDART

    Abstract: An object stores a signature associated therewith. An authentication method includes generating in the object at least one piece of personalized information of the object based on the stored signature and on at least one indication associated with the object, and communicating without contact by a device to the object during the authentication. The method also includes contactless communications to the device of the at least one piece of personalized information, determining by the device the signature based on at least the one piece of personalized information and on the at least one indication, and verifying the signature by the device.

    Abstract translation: 对象存储与其相关联的签名。 认证方法包括:根据所存储的签名和关于对象的至少一个指示,在对象中生成对象的至少一条个性化信息,以及在认证期间通过设备与对象进行通信。 该方法还包括至少一条个性化信息到设备的非接触式通信,由设备基于至少一条个性化信息和该至少一个指示来确定签名,并且验证该设备的签名 。

    PROTECTION OF AN INTEGRATED CIRCUIT AGAINST ATTACKS
    5.
    发明申请
    PROTECTION OF AN INTEGRATED CIRCUIT AGAINST ATTACKS 审中-公开
    保护集成电路防止攻击

    公开(公告)号:US20150194393A1

    公开(公告)日:2015-07-09

    申请号:US14667232

    申请日:2015-03-24

    Abstract: An integrated circuit, including: a semiconductor substrate of a first conductivity type; a plurality of regions of the first conductivity type vertically extending from the surface of the substrate, each of the regions being laterally delimited all along its periphery by a region of the second conductivity type; and a device for detecting a variation of the substrate resistance between each region of the first conductivity type and an area for biasing the substrate to a reference voltage.

    Abstract translation: 一种集成电路,包括:第一导电类型的半导体衬底; 所述第一导电类型的多个区域从所述基板的表面垂直延伸,每个所述区域沿着其外围沿着所述第二导电类型的区域横向界定; 以及用于检测第一导电类型的每个区域和用于将衬底偏压的区域之间的衬底电阻变化为参考电压的装置。

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