公开(公告)号：US20140013177A1

公开(公告)日：2014-01-09

申请号：US14019329

申请日：2013-09-05

Applicant: STMicroelectronics Pvt. Ltd.

Inventor： Parul Bansal

IPC: G01R31/3177

CPC classification number: G01R31/3177 ,  G06F11/3656

Abstract: An on-chip functional debugger includes one or more functional blocks each providing one or more functional outputs. A hierarchical selection tree is formed by one or more selectors having the output of one of the selectors as a final output and individual selector inputs coupled either to a functional output from the functional blocks or to an output of another selector. A selection signal coupled to the select input of each of the selectors to enable a selected one of its output. An output node coupled to the final output. A method of providing on-chip functional debugging is also provided. A desired functional output from one or more available functional outputs is selected and then the selected functional output is coupled to an output node.

Abstract translation: 片上功能调试器包括一个或多个功能块，每个功能块提供一个或多个功能输出。 分层选择树由具有选择器之一的输出的一个或多个选择器形成为最终输出，以及耦合到功能块的功能输出或另一个选择器的输出的单独选择器输入。 选择信号，其耦合到每个选择器的选择输入以使得其输出中的所选择的一个。 耦合到最终输出的输出节点。 还提供了一种提供片上功能调试的方法。 选择来自一个或多个可用功能输出的期望的功能输出，然后所选择的功能输出耦合到输出节点。