Abstract:
An FDSOI integrated circuit die supplies on an output node a regulated output voltage based on a reference voltage. A pass transistor that passes a first current to the output node. A feedback loop regulates the output voltage by generating a second current based on the first current and applying a control signal to the pass transistor based on the second current. A loop current adaptor adapts a ratio of the first and second currents by adjusting a back gate bias voltage applied to a back gate of loop transistor of the feedback loop.
Abstract:
An embodiment of a non-volatile memory device includes: a memory array, having a plurality of non-volatile logic memory cells arranged in at least one logic row, the logic row including a first row and a second row sharing a common control line; and a plurality of bit lines. Each logic memory cell has a direct memory cell, for storing a logic value, and a complementary memory cell, for storing a second logic value, which is complementary to the first logic value in the corresponding direct memory cell. The direct memory cell and the complementary memory cell of each logic memory cell are coupled to respective separate bit lines and are placed one in the first row and the other in the second row of the respective logic row.
Abstract:
A circuit including a data storage element; first and second input circuitry coupled respectively to first and second inputs of the data storage element and each including a plurality of components adapted to generate, as a function of an initial signal, first and second input signals respectively provided to the first and second inputs; wherein the data storage element includes a first storage node and is configured such that a voltage state stored at the first storage node is protected from a change in only one of the first and second input signals by being determined by the conduction state of a first transistor coupled to the first storage node and controlled based on the first input signal and by the conduction state of a second transistor coupled to the first storage node and controlled based on the second input signal.
Abstract:
A Voltage regulator includes a first input terminal configured to receive an input supply voltage, includes a second input terminal configured to receive a regulated output supply voltage as a function of the input supply voltage or to receive a test supply voltage and comprises a power transistor including an input terminal configured to receive the input supply voltage and including an output terminal configured to generate the regulated output supply voltage. The Voltage regulator is configured, during a start-up phase of a test operation mode, to receive a control signal equal to the input supply voltage, is configured to receive the input supply voltage having a substantially increasing trend, detect that the input supply voltage is equal to a first voltage threshold and generate, as a function of the detected signal and of the control signal, a by-pass signal having a transition from a first logic value to a second logic value for indicating a by-pass status of the Voltage regulator, and is configured to receive the by-pass signal having the second logic value and open the power transistor. The second input terminal is configured, during the test operation mode, to receive the test supply voltage having a test value different from a nominal value of the regulated output supply voltage.
Abstract:
In a method for recovery of a dock from a received digital data stream and an apparatus for recovering a clock from a received digital data stream, phase-shifted dock signals are generated from a receiver's dock. After selecting one of the phase-shifted clock signals, two other phase-shifted clock signals are determined. Depending on sample values taken at rising/falling edges of the three selected phase-shifted clock signals, counter values are increased and compared. The selection of phase-shifted clock signals and the steps of sampling the input digital data stream, comparing the values and increasing counter values, if required, are repeatedly performed until the comparison result of the counter values indicates that one of the latter determined phase-shifted clock signals strobes the received digital data stream in the centre of a bit period.
Abstract:
A circuit includes a discharge arrangement configured to discharge an electrostatic charge. The discharge arrangement has a discharge state. A first circuit is configured to provide a pulse to the discharge arrangement when the electrostatic charge is sensed. The pulse causes the discharge arrangement to enter the discharge state. A second circuit is configured to maintain the discharge arrangement in the discharge state after the pulse has ended. A third circuit is configured to receive the pulse and to provide a delayed output to the discharge arrangement. The delayed output causes the discharge arrangement to exit the discharge state.
Abstract:
An improved method and apparatus for reloading frames in which errors are detected during the Programmable Logic Device configuration. A configuration data frame for a FPGA is loaded to the Frame register of the FPGA and also to an error detection circuit which detects errors with the loaded frame. An error counter value is maintained by the apparatus and is incremented each time an error with a frame is detected. The incremented value is compared by a Comparator circuit with a pre-determined threshold value nullnnull. If a match is found then the configuration process is aborted, else the data frame is reloaded in the configuration memory, transferred again to the frame register and rechecked for errors. If no error is detected with the reloaded frame, the error counter value is reset and the next frame is loaded until the FPGA configuration process is over.
Abstract:
An improved latch-type sense amplifier circuit having two cross-coupled inverters forming a latch, a supply coupling device for selectively connecting the latch to a supply source, and a bit line coupling circuits for selectively connecting the inputs of each inverter to the complimentary bit line from the memory array. The circuit is configured to sense a voltage difference between the bit lines with improved reliability by providing a delayed sense amplifier enable signal to pass transistors for delaying disconnection of the bit lines from the sense amplifier until the latching action is completed, and adding two transistors in series with the existing transistors of the conventional latch for correcting the offset between the threshold voltages of the inverters of the latch.
Abstract:
A CMOS output buffer uses feedback from a ground node to reduce ground bounce by utilizing a tolerable ground bounce limit, making it less sensitive to operating conditions and processing parameters. An input to the NMOS device of the output buffer is provided by the output of a control element which receives a first input from a pre-driver and a second input (i.e., the feedback) from the ground node.
Abstract:
A voltage level translator for digital logic circuits provides high level to low level voltage translation with equal rise and fall delays. The voltage level translator may include an input high voltage logic inverter (operating at the high voltage level) and connected to an output low voltage logic inverter operating at the low voltage level via a voltage reduction circuit. A related method for providing high level to low voltage translation may include providing an input inverter operating at the high voltage level and an output inverter operating at the low voltage level. Furthermore, the output of the high voltage inverter may be coupled to the input of the low voltage inverter after reducing the output voltage of the high voltage inverter to the required level.