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公开(公告)号：US08994136B2
公开(公告)日：2015-03-31
申请号：US14017787
申请日：2013-09-04
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jae-chul Park , Young Kim , Chae-hun Lee , Yong-woo Jeon , Chang-jung Kim
IPC: H01L31/105 , H01L21/00 , H01L31/103 , H01L27/144
CPC classification number: H01L31/105 , G01T1/2018 , G01T1/208 , H01L27/1446 , H01L27/14658 , H01L31/103 , H01L31/107
Abstract: A silicon photomultiplier detector cell may include a photodiode region and a readout circuit region formed on a same substrate. The photodiode region may include a first semiconductor layer exposed on a surface of the silicon photomultiplier detector cell and doped with first type impurities; a second semiconductor layer doped with second type impurities; and/or a first epitaxial layer between the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may contact the first semiconductor layer and the second semiconductor layer. The first epitaxial layer may be doped with the first type impurities at a concentration lower than a concentration of the first type impurities of the first semiconductor layer.
Abstract translation: 硅光电倍增管检测器单元可以包括形成在同一衬底上的光电二极管区域和读出电路区域。 光电二极管区域可以包括暴露在硅光电倍增管检测器单元的表面上并掺杂有第一类型杂质的第一半导体层; 掺杂有第二类型杂质的第二半导体层; 和/或在第一半导体层和第二半导体层之间的第一外延层。 第一外延层可以接触第一半导体层和第二半导体层。 第一外延层可以以低于第一半导体层的第一类型杂质的浓度的浓度掺杂第一类型的杂质。
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Patent Agency Ranking
2.发明授权公开(公告)号：US09958557B2
公开(公告)日：2018-05-01
申请号：US14947666
申请日：2015-11-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jin-myoung Kim , Kang-ho Lee , Chae-hun Lee , Jae-chul Park
Abstract: Provided are photon counting apparatuses and methods, and radiographic imaging apparatuses configured to receive charge signals corresponding to incident radiation photons, and to count the incident radiation photons by using a plurality of counting bits, such that the counting changes only one counting bit from among the plurality of counting bits when the count value is increased by one. By using the photon counting methods, a data-change frequency of photon counting data corresponding to radiation photons is minimized while counting the radiation photons based on charge signals corresponding to input radiation photons.
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公开(公告)号：US08985853B2
公开(公告)日：2015-03-24
申请号：US13904600
申请日：2013-05-29
Applicant: Samsung Electronics Co., Ltd.
Inventor： Chae-hun Lee , Jae-chul Park , Young Kim , Ho Kyung Kim , Dae-kun Yoon
CPC classification number: G01T7/005
Abstract: A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.
Abstract translation: 校准作为X射线检测器的多个单位单元的每个单位单元的X射线检测的参考的第一阈值电压的方法可以包括通过使用多个第二阈值电压来检测X射线 具有不同能级的光谱的多个X射线; 确定在X射线的光谱中具有最大强度的能量与检测到具有相同能量强度的最大光子数的第三阈值电压之间的对应关系; 和/或基于确定的对应关系来校准第一阈值电压。
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公开(公告)号：US09658349B2
公开(公告)日：2017-05-23
申请号：US14080031
申请日：2013-11-14
Applicant: Samsung Electronics Co., Ltd.
Inventor： Chae-hun Lee , Young Kim , Jae-chul Park , Yong-woo Jeon
CPC classification number: G01T1/2985 , G01T1/2008
Abstract: An apparatus for generating an image may include a plurality of scintillator layers configured to convert an incident beam into an optical signal; a plurality of micro cells configured to turn on or off depending on whether or not the micro cells detect the optical signal; a reaction depth determining unit configured to detect a decay pattern of the optical signal, on the basis of on/off signals of the micro cells, and configured to determine a type of the scintillator layers with which the incident beam has reacted; and/or a reading unit configured to decide an occurrence location of the incident beam and then generates a photographed image.
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5.发明授权Driver circuit for outputting photon counting including a multiplexer, inverter and power supply 有权用于输出光子计数的驱动电路，包括多路复用器，逆变器和电源公开(公告)号：US09577645B2
公开(公告)日：2017-02-21
申请号：US13894526
申请日：2013-05-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dae-kun Yoon , Young Kim , Chae-hun Lee , Chang-jung Kim , Jae-chul Park
Abstract: A driver circuit outputs a result of classifying and counting photons based on one or more energy levels to a column line. The driver circuit includes a multiplexer for receiving the result from a counter, a driving inverter for receiving a signal from the multiplexer and a power supply, and a switch connected between the power supply and an input terminal of the driving inverter.
Abstract translation: 驱动器电路输出基于一个或多个能量级别的光子对列线进行分类和计数的结果。 驱动器电路包括用于从计数器接收结果的多路复用器，用于从多路复用器接收信号的驱动逆变器和电源，以及连接在电源和驱动逆变器的输入端之间的开关。
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公开(公告)号：US09086324B2
公开(公告)日：2015-07-21
申请号：US13763944
申请日：2013-02-11
Applicant: Samsung Electronics Co., Ltd. , Industry-University Cooperation Foundation Sogang University
Inventor： Young Kim , Jae-chul Park , Dae-kun Yoon , Chae-hun Lee , Jin-wook Burm , Kyung-hoon Kim , Jun-an Lee
CPC classification number: G01J1/44 , G01T1/2006 , G01T1/2018 , G01T1/208
Abstract: A photomultiplier detector cell for tomography includes a detector unit and a readOUT unit. The detector unit is configured to generate a digitized detect signal in response to receives light having a certain range of wavelength. The readOUT unit is configured to generate an output signal corresponding to the detect signal generated by the detector unit and to transmit the output signal to an external circuit. The readOUT unit is configured to transmit the output signal to the external circuit right after the detect signal is received.
Abstract translation: 用于层析成像的光电倍增管检测器单元包括检测器单元和读出单元。 检测器单元被配置为响应于接收到具有一定波长范围的光而产生数字化的检测信号。 读出单元被配置为生成与由检测器单元生成的检测信号相对应的输出信号，并将输出信号发送到外部电路。 读出单元被配置为在接收到检测信号之后立即将输出信号发送到外部电路。
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