公开(公告)号：US20240125841A1

公开(公告)日：2024-04-18

申请号：US18454404

申请日：2023-08-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Cheongwon Lee ,  Gyosoo Choo ,  Youngwoo Park ,  Seunghoon Lee ,  Jinwoo Choi

IPC: G01R31/26

CPC classification number: G01R31/2607

Abstract: An embodiment provides a test element group (TEG) circuit, including: a first pad configured for a test voltage to be applied; an amplifier including a first input terminal connected to the first pad, a second input terminal connected to a first terminal of a test transistor, and an output terminal electrically connected to the second input terminal; a variable resistor including one terminal connected to the output terminal of the amplifier and the other terminal connected to the first terminal of the test transistor; and a gate driving circuit that supplies a gate voltage to a gate of the test transistor.