公开(公告)号：US20220102839A1

公开(公告)日：2022-03-31

申请号：US17475507

申请日：2021-09-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Pilwon SEO ,  Bomi LEE ,  Sangil IM ,  Ilseub KIM ,  Heedong KIM ,  Yeonkwan SEO

IPC: H01Q1/24 ,  H04B1/00 ,  H01Q1/48

Abstract: An electronic device and method are disclosed. The electronic device includes a first antenna configured to communicate using a first frequency band group, a ground switch coupled to the first antenna, a second antenna configured to communicate using a second frequency band group, wherein the second antenna overlaps the first antenna, a band selection switch configured to select one of multiple radio frequency (RF) paths for the second frequency band group, and a processor. The processor implements the method, including determining a communication frequency band, when the communication frequency band is unsupported by the second antenna, identifying an RF path corresponding to the communication frequency band from among the multiple RF paths, and controlling the band selection switch to select the identified RF path for operative connection to the second antenna.

公开(公告)号：US20230114817A1

公开(公告)日：2023-04-13

申请号：US17857291

申请日：2022-07-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Inho SHIN ,  Wookrae KIM ,  Changhyeong YOON ,  Myungjun LEE ,  Heonju SHIN ,  Sangil IM ,  Sungho JANG

IPC: G06T7/62 ,  G06T7/00

Abstract: A semiconductor measurement apparatus includes an illumination unit including a light source, and a polarizer disposed on a propagation path of light emitted from the light source; an optical unit configured to direct the light passing through the polarizer to be incident onto a sample, and to transmit the light, reflected from the sample, to an image sensor; and a controller configured to process an original image, output by the image sensor, to determine a critical dimension of a structure included in a region of the sample on which the light is incident. The controller acquires a two-dimensional image. The controller orthogonally decomposes the two-dimensional image corresponding to a selected wavelength into a plurality of bases, generates one-dimensional data including a plurality of weights corresponding to the plurality of bases, and uses the one-dimensional data to determine a selected critical dimension among critical dimensions of the structure.