公开(公告)号：US09792175B2

公开(公告)日：2017-10-17

申请号：US14919363

申请日：2015-10-21

Applicant: SanDisk Technologies LLC

Inventor： Sahil Sharma ,  Abhijeet Manohar ,  Mrinal Kochar ,  Yong Huang ,  Derek McAuley ,  Mikhail Palityka ,  Ivan Baran ,  Aaron Lee

IPC: G11C29/00 ,  G06F11/10 ,  G11C29/52

CPC classification number: G06F11/1068 ,  G11C16/3418 ,  G11C29/02 ,  G11C29/028 ,  G11C29/42 ,  G11C29/44 ,  G11C29/52

Abstract: When the number of bad columns in a memory or plane is less than a threshold number then a first Error Correction Code (ECC) scheme encodes user data in first pages of a first size. If the number of bad columns is greater than the threshold number then a second ECC scheme encodes the user data in second pages of a second size that is smaller than the first size.