MEMORY SYSTEM
    1.
    发明申请
    MEMORY SYSTEM 审中-公开

    公开(公告)号:US20190252012A1

    公开(公告)日:2019-08-15

    申请号:US16396215

    申请日:2019-04-26

    申请人: SK hynix Inc.

    发明人: Young-Dong ROH

    摘要: A memory system may include: a controller suitable for: generating a first clock and first pattern data having a first phase difference, in a write calibration mode, calibrating, the first phase difference depending on a second information, in a read calibration mode, detecting, a first and second value of the first and second pattern data according to the first and second clock, generating, a first information according to comparing of the first and second values, receiving by calibrating, a second phase difference generated by a memory device depending on the first information; and the memory device suitable for: generating the second clock and the second pattern data having the second phase difference, in the write calibration mode, detecting, a first and second value of the first and second pattern data according to the first and second clock, generating, the second information according to comparing of the first and second values.

    MEMORY DEVICE AND OPERATION METHOD OF THE SAME

    公开(公告)号:US20190196904A1

    公开(公告)日:2019-06-27

    申请号:US16056897

    申请日:2018-08-07

    申请人: SK hynix Inc.

    发明人: Sung-Ho KIM

    IPC分类号: G06F11/10 G11C29/52 H03M13/29

    摘要: A memory device includes: a non-volatile memory circuit suitable for storing defective column information; a defective latch circuit suitable for receiving and storing the defective column information from the non-volatile memory circuit during a boot-up operation; an error correction code generation circuit suitable for generating an error correction code for correcting an error of the defective column information based on the defective column information; an error correction code latch circuit suitable for storing the error correction code; an error correction circuit suitable for correcting an error of the defective column information transferred from the defective latch circuit based on the error correction code which is transferred from the error correction code latch circuit so as to produce an error-corrected defective column information; and a memory bank suitable for performing a column repair operation based on the error-corrected defective column information.