ROBUST SECURE TESTING OF INTEGRATED CIRCUITS

    公开(公告)号:US20190033374A1

    公开(公告)日:2019-01-31

    申请号:US15704515

    申请日:2017-09-14

    Abstract: A method includes configuring a first set of blocks of a plurality of blocks of an IC chip as secure data blocks, and configuring a second set of blocks of the plurality of blocks as non-secure data blocks. The method further includes receiving a test mode entry request in the IC chip. In response to the IC chip receiving the test mode entry request, carrying out a data-initialization operation on the plurality of blocks independently of whether any blocks of the plurality of blocks are configured as the secure data blocks or the non-secure data blocks. An IC chip data output is disabled during the data-initialization operation.

    Robust secure testing of integrated circuits

    公开(公告)号:US10481205B2

    公开(公告)日:2019-11-19

    申请号:US15704515

    申请日:2017-09-14

    Abstract: A method includes configuring a first set of blocks of a plurality of blocks of an IC chip as secure data blocks, and configuring a second set of blocks of the plurality of blocks as non-secure data blocks. The method further includes receiving a test mode entry request in the IC chip. In response to the IC chip receiving the test mode entry request, carrying out a data-initialization operation on the plurality of blocks independently of whether any blocks of the plurality of blocks are configured as the secure data blocks or the non-secure data blocks. An IC chip data output is disabled during the data-initialization operation.

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