公开(公告)号：US20220392543A1

公开(公告)日：2022-12-08

申请号：US17481225

申请日：2021-09-21

Applicant: Silicon Storage Technology, Inc.

Inventor： VIKTOR MARKOV ,  ALEXANDER KOTOV

IPC: G11C16/26 ,  G11C16/04 ,  G11C16/14 ,  G11C16/34

Abstract: A memory device and method for a non-volatile memory cell having a gate that includes programming the memory cell to an initial program state corresponding to a target read current and a threshold voltage, including applying a program voltage having a first value to the gate, storing the first value in a memory, reading the memory cell in a first read operation using a read voltage applied to the gate that is less than the target threshold voltage to generate a first read current, and subjecting the memory cell to additional programming in response to determining that the first read current is greater than the target read current. The additional programming includes retrieving the first value from the memory, determining a second value greater than the first value, and programming the selected non-volatile memory cell that includes applying a program voltage having the second value to the gate.