MATERIAL INSPECTION METHODS AND DEVICES
    1.
    发明申请
    MATERIAL INSPECTION METHODS AND DEVICES 有权
    材料检验方法和设备

    公开(公告)号:US20090303064A1

    公开(公告)日:2009-12-10

    申请号:US12477346

    申请日:2009-06-03

    IPC分类号: G08B21/00

    摘要: Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.

    摘要翻译: 公开了材料检查装置的用户对所检查材料的厚度变化的警示。 从校准信息确定厚度偏移。 校准信息标识通过参考样品的脉冲的飞行时间,其类似于待检查的材料。 厚度偏移表示被检查材料的厚度何时与参考样品的厚度不同。 设置校准厚度报警,校准厚度报警对应于厚度偏移。 检测被检查材料的厚度变化。 校准厚度警报器被接合以向检查装置的用户通知检测到的被检查材料的厚度的变化。

    Material inspection methods and devices
    2.
    发明授权
    Material inspection methods and devices 有权
    材料检验方法和装置

    公开(公告)号:US08174407B2

    公开(公告)日:2012-05-08

    申请号:US12477346

    申请日:2009-06-03

    IPC分类号: G08B21/00

    摘要: Alerting a user of a material inspection device to a change in thickness of a material being inspected is disclosed. A thickness offset is determined from calibration information. The calibration information identifies a time of flight of a pulse through a reference sample similar in composition to a material to be inspected. The thickness offset indicates when a thickness of a material being inspected differs from a thickness of the reference sample. A calibration thickness alarm is set, the calibration thickness alarm corresponding to the thickness offset. A change in thickness of the material being inspected is detected. The calibration thickness alarm is engaged to alert the user of the inspection device of a detected change in thickness of the material being inspected.

    摘要翻译: 公开了材料检查装置的用户对所检查材料的厚度变化的警示。 从校准信息确定厚度偏移。 校准信息标识通过参考样品的脉冲的飞行时间,其类似于待检查的材料。 厚度偏移表示被检查材料的厚度何时与参考样品的厚度不同。 设置校准厚度报警,校准厚度报警对应于厚度偏移。 检测被检查材料的厚度变化。 校准厚度警报器被接合以向检查装置的用户通知检测到的被检查材料的厚度的变化。

    System and method for derivation and real-time application of acoustic V-path correction data
    3.
    发明授权
    System and method for derivation and real-time application of acoustic V-path correction data 有权
    声V校正数据的推导和实时应用系统和方法

    公开(公告)号:US08156784B2

    公开(公告)日:2012-04-17

    申请号:US12631065

    申请日:2009-12-04

    IPC分类号: G01B17/02

    摘要: A system and method for carrying out non-destructive testing and inspection of test objects to assess their structural integrity uses a calibration module configured to provide V-Path time of flight (TOF) correction data over a plurality of object thickness points, obtained from an object or objects having known thicknesses using the same physical probe as is used for the inspection measurements. When a probe launches acoustical waves into a test object and an instrument and a control system compute a time of flight value of the acoustical waves launched by the probe, the pre-obtained V-Path TOF correction data is used to correct the measured time of flight computed by the instrument.

    摘要翻译: 用于对测试对象进行非破坏性测试和检查以评估其结构完整性的系统和方法使用校准模块,该校准模块被配置为在多个对象厚度点上从多个对象厚度点提供V-Path飞行时间(TOF)校正数据, 使用与用于检查测量的物理探针相同的物理探针具有已知厚度的物体或物体。 当探测器将探测声波发射到测试对象中并且仪器和控制系统计算由探测器发射的声波的飞行时间值时,预先获得的V-Path TOF校正数据用于校正测量时间 飞行计算仪器。

    Reciprocal interface panels suitable for multi-purpose actuators
    5.
    发明授权
    Reciprocal interface panels suitable for multi-purpose actuators 有权
    互动接口面板适用于多用途执行器

    公开(公告)号:US08913006B2

    公开(公告)日:2014-12-16

    申请号:US13363550

    申请日:2012-02-01

    摘要: A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.

    摘要翻译: 无损检测和测试仪器包括壳体和具有要组装到壳体上的第一类型输入的第一面板和具有不同的第二类型输入的第二面板,以组装到壳体上。 用于第一面板的第一GUI模块在第一类型输入的致动时实现功能。 用于第二面板的第二GUI模块在第二类型输入的致动时实现相同的功能。 控制器被配置为当第一面板与仪器相关联时选择第一GUI模块,并且当第二面板与仪器相关联时选择第二GUI模块。