MEASURING DEVICE
    1.
    发明公开
    MEASURING DEVICE 审中-公开

    公开(公告)号:US20240315612A1

    公开(公告)日:2024-09-26

    申请号:US18680223

    申请日:2024-05-31

    CPC classification number: A61B5/14532 A61B5/1455 A61B5/681

    Abstract: A measuring device includes a first light emitting section that emits first light; a light collecting section that has a first surface, a second surface that faces the first surface and that has a larger area than the first surface, and a wall surface that connects the first surface and the second surface and that allows the first light to pass therethrough; a light receiving section that is disposed on the first surface to receive the first light irradiated onto a living body from the second surface and returned from the living body; and a calculation section that receives an output from the light receiving section to calculate numerical information regarding the living body.

    OPTICAL UNIT AND DISPLACEMENT MEASURING DEVICE
    2.
    发明申请
    OPTICAL UNIT AND DISPLACEMENT MEASURING DEVICE 有权
    光学单元和位移测量装置

    公开(公告)号:US20160216101A1

    公开(公告)日:2016-07-28

    申请号:US15003548

    申请日:2016-01-21

    Abstract: An optical unit includes: a first diffraction grating where light from a light source enters; a second diffraction grating that generates interference light as a result of diffracted light rays emitted from the first diffraction grating entering the second diffraction grating; and an optical member including a pair of reflective surfaces that are parallel and opposite to each other, the optical member being configured such that the pair of reflective surfaces respectively reflect ±mth-order diffracted light rays that are diffracted light rays of a specific order among a plurality of orders of the diffracted light rays emitted from the first diffraction grating so as to guide the ±mth-order diffracted light rays to the second diffraction grating, where m is a natural number.

    Abstract translation: 光学单元包括:来自光源的光进入的第一衍射光栅; 第二衍射光栅,其由于从进入第二衍射光栅的第一衍射光栅发射的衍射光线产生干涉光; 以及光学构件,其包括彼此平行和相对的一对反射表面,所述光学构件被构造成使得所述一对反射表面分别反射作为特定次序的衍射光线的±m级衍射光线 从第一衍射光栅发射的衍射光线的多个次数,以将±第m级衍射光线引导到第二衍射光栅,其中m是自然数。

    LOAD CELL
    3.
    发明申请
    LOAD CELL 审中-公开

    公开(公告)号:US20180106690A1

    公开(公告)日:2018-04-19

    申请号:US15787429

    申请日:2017-10-18

    CPC classification number: G01L1/22 G01L1/04 G01L1/06 G01L1/2206 G01L1/24 G01L1/25

    Abstract: In one aspect, a load cell includes an elastic body, first optical unit, second optical unit, detector, and computation unit. The first optical unit has a light source, a first diffraction grating on which light from the light source is incident, and a light-receiving unit. The first optical unit is fixed to a first end portion of the elastic body and arranged within a hollow portion of the elastic body. The second optical unit has a second diffraction grating on which diffracted light from the first diffraction grating is incident to generate interference light. The second optical unit is fixed to a second end portion of the elastic body and arranged within the hollow portion. The detector detects the interference light. The computation unit computes a relative displacement amount of the second diffraction grating relative to the first diffraction grating on the basis of a signal obtained by the detector.

    DISPLACEMENT MEASUREMENT DEVICE AND DISPLACEMENT MEASUREMENT METHOD
    4.
    发明申请
    DISPLACEMENT MEASUREMENT DEVICE AND DISPLACEMENT MEASUREMENT METHOD 有权
    位移测量装置和位移测量方法

    公开(公告)号:US20160116305A1

    公开(公告)日:2016-04-28

    申请号:US14989675

    申请日:2016-01-06

    CPC classification number: G01D5/266 G01D5/38 G01M11/08

    Abstract: A displacement measurement device includes: a light source; a first diffraction grating and a second diffraction grating arranged along a path of light from the light source and movable relative to one another, the first and second diffraction gratings generating diffracted light; an optical sensor that detects interference light produced by interference between −nth order diffracted light generated as a result of the second diffraction grating diffracting +nth order diffracted light from the first diffraction grating and +nth order diffracted light generated as a result of the second diffraction grating diffracting −nth order diffracted light from the first diffraction grating, where n is a natural number greater than or equal to 1; and a calculation unit calculating, according to a signal from the optical sensor, a relative displacement between the first and second diffraction gratings in a direction orthogonal to an optical axis of the first and second diffraction gratings.

    Abstract translation: 位移测量装置包括:光源; 第一衍射光栅和第二衍射光栅,沿着来自光源的光的路径布置并且可相对于彼此移动,第一和第二衍射光栅产生衍射光; 检测由作为第二衍射光栅衍射的结果产生的第二级衍射光之间的干涉产生的干涉光,衍射光衍射来自第一衍射光栅的+ n级衍射光和作为第二衍射产生的第n级衍射光 光栅衍射 - 衍射来自第一衍射光栅的衍射光,其中n是大于或等于1的自然数; 以及计算单元,根据来自所述光学传感器的信号,计算所述第一和第二衍射光栅在与所述第一和第二衍射光栅的光轴正交的方向上的相对位移。

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