Abstract:
The invention relates to a determination process of the presence of a wire-edge at the site of an internal edge of a ring surface (16) of a ring of a container, comprising: lighting of the ring surface (16) of the container from above, by means of a radial light beam at 360 and its observation according to a peripheral observation field formation in a first image zone, of a first principal circle; and of at least one secondary arc of a circle concentric to the first so-called principal circle, and radially offset relative to the latter. search, in said first image zone, of the first so-called principal circle and any first secondary arc of a circle. The invention also relates to a device for executing such a process and a line comprising such a device.
Abstract:
The invention relates to a device and a method for measuring the kinematic characteristics of free fall of a glass gob with four distinct linear cameras each having an observed linear field intercepting the theoretical free fall path, respectively at a first high point of interception and at a first low point of interception, offset from each other according to the theoretical free fall path, and respectively at a second high point of interception and at a second low point of interception, offset from each other along the direction of the theoretical free fall path, the high respectively low optical axes being distinct from each other in projection on a plane perpendicular to the direction of the theoretical free fall path. The invention also comprises a method for controlling a glass article molding installation.
Abstract:
The invention relates to a method for inspecting containers, comprising: providing a first source of light illuminating the containers, said source being composed of a plurality of elementary light sources that are controlled so as to define at least three illumination zones (S11); providing at least three image sensors (C11, C12, C13); acquiring at least one image of the container illuminated by an associated illumination zone, the elementary light sources of the illumination zones (S11) being controlled so that: the at least three illumination zones (S11) associated with the image sensors have identical angular widths (L11); the at least three illumination zones (S11) associated with the image sensors have symmetric angular widths (L11); and at least two angularly neighbouring illumination zones have a common illumination portion (S112).
Abstract:
The invention relates to an optical-computing device and method for analysing a container (12) made of transparent or translucent material by means of a polarimetric camera (18), comprising: —acquiring at least one master digital image (IM) of the container using the photoelectric sensor (22) of the polarimetric camera; —computing an intensity image (It) in which the value of each intensity pixel (Pt(n)) is an averaged value of the value of at least two pixels of the master digital image corresponding to two circular analyses in opposite directions to one another, or two linear analyses of orthogonal polarisation axes or two orthogonal elliptical analyses; —computing at least one phase-shift image (ID) by calculating, for a series of composite pixels, a phase-shift pixel (Pd(n)) from the value of a set of one or more partial pixel(s) (Ppk(n)) belonging to a combination of one or more partial images (Ipk).
Abstract:
A method for measuring the thickness of glass containers includes the following steps: choosing to measure the radiation emitted by the container from a first side and a second side of the container diametrically opposite to each other; choosing to measure the radiation emitted by the container in a first spectral band in a range between 2,800 nm and 4,000 nm and in a second spectral band; simultaneously measuring, from each side of the container, the intensity of the radiation coming from the walls in the first spectral band and in the second spectral band; and determining at least the thickness of the first wall and of the second wall (22), from the measurements of the intensity of the radiation coming from the first wall in the first and second spectral bands and from the second wall in the first and second spectral bands.
Abstract:
The invention relates to a method, a device and an inspection line for determining the three-dimensional geometry of a container ring surface, including the formation, by two optical systems (24, 24′), of two images of the ring surface of the container, according to two peripheral observation fields having a first and a second observation elevation angle (γ1, γ2) different from each other.
Abstract:
The invention relates to a method of visualizing the planeness of a ring surface (16) of a container (14), the method consisting in: lighting the ring surface from above using a peripheral incident light beam having radial rays with specular reflection on the ring surface; and using an optical system (24, 124) to form a plane image of the ring surface on a sensor (18), with an optical geometrical transformation that converts a real height difference (dZ) into an image radial offset (dR) on the image, and the image radial offset (dR) corresponding to a unit real height difference (dZ) is greater than the image radial offset corresponding to a real radial offset of the same dimension. The invention also provides a device and an installation implementing such a method.
Abstract:
The invention relates to a method of inspecting containers (3) moving between a linear camera and a light source (7) presenting continuous variation of light intensity with a periodic pattern (71) along at least one variation direction (D). According to the invention: for each movement increment of the container, a sequence of N successive image lines of the container is acquired cyclically so that for each image line: the container (3) is illuminated by the light source (7); the image line of the container is acquired; and the periodic pattern (71) is shifted for the next line along the variation direction (D); for each increment of the container (3), at least one phase image line is calculated; and the phase image lines (LP(k)) are analyzed.