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公开(公告)号:US20230068139A1
公开(公告)日:2023-03-02
申请号:US17459827
申请日:2021-08-27
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chih-Wei CHOU , Yuan-Hsin CHI , Yin-Tun CHOU , Hung-Chih WANG , Yu-Chi LIU , Chih-Ming WANG
IPC: H01L21/687 , H01L21/285 , H01L21/768
Abstract: A clamp ring including an inner periphery of increased diameter at locations where inwardly extending tabs are not located reduces the risk a workpiece that is placed in close proximity to the clamp ring or which contacts the clamp ring during processing will stick to the clamp ring.
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公开(公告)号:US20240387233A1
公开(公告)日:2024-11-21
申请号:US18786382
申请日:2024-07-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chih-Wei CHOU , Yuan-Hsin CHI , Yin-Tun CHOU , Hung-Chih WANG , Yu-Chi LIU , Chih-Ming WANG
IPC: H01L21/687 , H01L21/285 , H01L21/768
Abstract: A clamp ring including an inner periphery of increased diameter at locations where inwardly extending tabs are not located reduces the risk a workpiece that is placed in close proximity to the clamp ring or which contacts the clamp ring during processing will stick to the clamp ring.
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公开(公告)号:US20230373100A1
公开(公告)日:2023-11-23
申请号:US17749051
申请日:2022-05-19
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chih-Wei CHOU , Sheng-Yuan LIN , Yuan-Hsin CHI , Hung-Chih WANG , Yu-Chi LIU
CPC classification number: B25J15/0014 , B25J11/0095
Abstract: The present disclosure is directed to a transfer blade including a first end segment, a second end segment opposite to the first end segment, and an intermediate segment extending from the first end segment to the second end segment. The first end segment includes a first contact region and the second end segment includes a second contact region. The first and second contact regions are configured to contact locations of a surface of a workpiece that do not overlap or are not aligned with a sensitive area of the workpiece. The sensitive area of the workpiece may be an EUV frame or a reticle of the workpiece. A non-contact region extends continuously along the first end segment, the intermediate segment, and the second end segment, and the non-contact region overlaps the sensitive area of the workpiece and is spaced apart from the sensitive area of the workpiece.
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