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公开(公告)号:US12169220B2
公开(公告)日:2024-12-17
申请号:US16523720
申请日:2019-07-26
Applicant: Texas Instruments Incorporated
Inventor: William Joshua Bush , Neeraj Bhardwaj , Erfan Shirazian , Madhusudan Sampath , James Scott Mason , Yazdi Contractor , Pavinkumar Ramasamy
Abstract: Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.
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公开(公告)号:US20200033403A1
公开(公告)日:2020-01-30
申请号:US16523720
申请日:2019-07-26
Applicant: Texas Instruments Incorporated
Inventor: William Joshua Bush , Neeraj Bhardwaj , Erfan Shirazian , Madhusudan Sampath , James Scott Mason , Yazdi Contractor , Pavinkumar Ramasamy
Abstract: Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.
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