公开(公告)号：US12169220B2

公开(公告)日：2024-12-17

申请号：US16523720

申请日：2019-07-26

Applicant: Texas Instruments Incorporated

Inventor： William Joshua Bush ,  Neeraj Bhardwaj ,  Erfan Shirazian ,  Madhusudan Sampath ,  James Scott Mason ,  Yazdi Contractor ,  Pavinkumar Ramasamy

IPC: G01R31/28 ,  G01R1/067 ,  G01R1/073

Abstract: Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.

公开(公告)号：US20200033403A1

公开(公告)日：2020-01-30

申请号：US16523720

申请日：2019-07-26

Applicant: Texas Instruments Incorporated

Inventor： William Joshua Bush ,  Neeraj Bhardwaj ,  Erfan Shirazian ,  Madhusudan Sampath ,  James Scott Mason ,  Yazdi Contractor ,  Pavinkumar Ramasamy

IPC: G01R31/28 ,  G01R1/073 ,  G01R1/067

Abstract: Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.