公开(公告)号：US10249729B1

公开(公告)日：2019-04-02

申请号：US15832696

申请日：2017-12-05

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Ying-Hsien Chen ,  Chun-Chia Chen ,  Yao-Jhan Wang ,  Chih-wei Yang ,  Te-Chang Hsu

IPC: H01L29/66 ,  H01L21/8238 ,  H01L21/308 ,  H01L21/02 ,  H01L21/3105 ,  H01L29/165 ,  H01L29/78 ,  H01L29/08

Abstract: A method for fabricating a semiconductor device. After forming SiGe epitaxial layer within the Core_p region, the hard mask is removed. A contact etch stop layer (CESL) is deposited on the composite spacer structure and the epitaxial layer. An ILD layer is deposited on the CESL. The ILD layer is polished to expose a top surface of the dummy gate. The dummy gate and a first portion of the first nitride-containing layer of the composite spacer structure are removed, thereby forming a gate trench and exposing the first gate dielectric layer. The first gate dielectric layer is removed from the gate trench, and a second portion of the first nitride-containing layer and the oxide layer are removed from the composite spacer structure, while leaving the second nitride-containing layer intact.