OFFSET AMOUNT CALIBRATING METHOD AND SURFACE PROFILE MEASURING MACHINE
    1.
    发明申请
    OFFSET AMOUNT CALIBRATING METHOD AND SURFACE PROFILE MEASURING MACHINE 有权
    偏移量校准方法和表面型材测量机

    公开(公告)号:US20110085177A1

    公开(公告)日:2011-04-14

    申请号:US12900788

    申请日:2010-10-08

    IPC分类号: G01B11/24

    摘要: An offset amount calibrating method that obtains the offset amount between a contact-type detector and an image probe for a surface profile measuring machine is provided. The method includes: setting on a stage a calibration jig that has a surface being provided with a lattice pattern with a level difference; measuring the lattice pattern of the calibration jig by the contact-type detector to obtain a first reference position of the lattice pattern; capturing the image of the lattice pattern of the calibration jig by the image probe to obtain a second reference position of the lattice pattern; and obtaining the offset amount from a difference between the first and second reference positions.

    摘要翻译: 提供了一种获得用于表面轮廓测量机的接触型检测器和图像探针之间的偏移量的偏移量校准方法。 该方法包括:在舞台上设置具有具有水平差的格子图案的表面的校准夹具; 通过接触型检测器测量校准夹具的格子图案,以获得格子图案的第一参考位置; 通过图像探测器捕获校准夹具的格子图案的图像,以获得格子图案的第二参考位置; 以及从所述第一和第二参考位置之间的差获得所述偏移量。