Paper identification counter and paper identification and counting method
    112.
    发明授权
    Paper identification counter and paper identification and counting method 有权
    纸张识别计数器和纸张识别和计数方法

    公开(公告)号:US06782987B1

    公开(公告)日:2004-08-31

    申请号:US09625359

    申请日:2000-07-25

    IPC分类号: G07K700

    CPC分类号: G07D11/0084 B65H2404/5311

    摘要: A paper identification counter comprises a counter body, a hopper which is formed to the counter body and to which papers to be identified and counted are fed, a paper conveyance unit including a conveyance passage along which the papers such as currency notes from the hopper is conveyed one by one in a direction of a short width side of the papers, a paper identification unit disposed on a way of the conveyance passage for identifying and counting the papers; and a stacker in which the papers delivered from the conveyance passage are stacked. The conveyance passage includes a U-shaped curvilinear conveyance region on a way between the hopper and the stacker.

    摘要翻译: 纸识别计数器包括对置体,料斗,其形成在对置主体上并被供给待识别和计数的纸张;纸输送单元,包括输送通道,诸如来自料斗的纸币等纸张沿着该输送通道 在纸张的宽度方向一个接一个地传送的纸张识别单元,设置在输送通道的通路上,用于识别和计数纸张; 以及堆叠器,其中从输送通道输送的纸张堆叠在其中。 输送通道包括在料斗和堆垛机之间的路上的U形曲线输送区域。

    Semiconductor device and method of manufacturing the same
    113.
    发明授权
    Semiconductor device and method of manufacturing the same 有权
    半导体器件及其制造方法

    公开(公告)号:US06593634B2

    公开(公告)日:2003-07-15

    申请号:US09834992

    申请日:2001-04-12

    IPC分类号: H01L2976

    CPC分类号: H01L21/84 H01L27/12

    摘要: A semiconductor device includes an NMOSFET and a PMOSFET. Each MOSFET includes first and second impurity diffusion layers for forming a source region and a drain region which are formed in a silicon layer of an SOI substrate or the like, a channel region formed between the first and second impurity diffusion layers, a gate insulation layer at least formed on the channel region, and a gate electrode formed on the gate insulation layer. The gate electrode includes a tantalum nitride layer in a region in contact with at least the gate insulation layer. The semiconductor device exhibits high current drive capability and can be manufactured at high yield.

    摘要翻译: 半导体器件包括NMOSFET和PMOSFET。 每个MOSFET包括用于形成在SOI衬底等的硅层中形成的源极区和漏极区的第一和第二杂质扩散层,形成在第一和第二杂质扩散层之间的沟道区,栅极绝缘层 至少形成在沟道区上,以及形成在栅极绝缘层上的栅电极。 栅电极在与至少栅极绝缘层接触的区域中包括氮化钽层。 该半导体器件具有高电流驱动能力并且可以高产率制造。