公开(公告)号：US20070116350A1

公开(公告)日：2007-05-24

申请号：US11285330

申请日：2005-11-21

Applicant: Mark Cheverton

Inventor： Mark Cheverton

IPC: G06K9/00

CPC classification number: G06T7/0004 ,  G06T7/33

Abstract: Disclosed herein is a method comprising acquiring an image of a display film or a mold with a camera; transferring the image to a computer; detecting an angle of alignment and/or a position of the display film or the mold from the image; detecting coordinates of defects located in the display film or the mold; and correcting the coordinates of the defects by compensating for the angle of alignment and/or the position of the display film or the mold.

Abstract translation: 这里公开了一种方法，包括用相机获取显示胶片或模具的图像; 将图像传输到计算机; 从图像中检测显示膜或模具的对准角和/或位置; 检测位于显示膜或模具中的缺陷的坐标; 以及通过补偿对准的角度和/或显示膜或模具的位置来校正缺陷的坐标。

公开(公告)号：US20060022156A1

公开(公告)日：2006-02-02

申请号：US10710708

申请日：2004-07-29

Applicant: Kevin Capaldo ,  Mark Cheverton ,  Kevin Harding ,  Robert Tait

Inventor： Kevin Capaldo ,  Mark Cheverton ,  Kevin Harding ,  Robert Tait

IPC: G01N21/88

CPC classification number: G01N21/95 ,  G01N2021/9513

Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

Abstract translation: 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。 最后，该系统包括可操作地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

公开(公告)号：US20120026564A1

公开(公告)日：2012-02-02

申请号：US12847105

申请日：2010-07-30

Applicant: Michael Teruki Takemori ,  Amitabh Bansal ,  Andrew A. Burns ,  Mark Cheverton ,  Sumeet Jain

Inventor： Michael Teruki Takemori ,  Amitabh Bansal ,  Andrew A. Burns ,  Mark Cheverton ,  Sumeet Jain

IPC: G03H1/26 ,  G03H1/02

CPC classification number: G03H1/04 ,  B42D25/328 ,  G03H1/0011 ,  G03H1/0248 ,  G03H1/181 ,  G03H1/2249 ,  G03H1/2645 ,  G03H1/28 ,  G03H2001/0016 ,  G03H2001/0044 ,  G03H2001/0415 ,  G03H2001/0432 ,  G03H2001/0434 ,  G03H2001/186 ,  G03H2001/2223 ,  G03H2001/2263 ,  G03H2001/2273 ,  G03H2001/2289 ,  G03H2270/31

Abstract: A method of making a hologram includes recording a first hologram in a holographic recording medium at a first deformation ratio; changing the first deformation ratio to a second deformation ratio that is different from the first deformation ratio; and recording a second hologram in the holographic recording medium at the second deformation ratio to form a recorded holographic medium.

Abstract translation: 制造全息图的方法包括以第一变形率将全息图记录在全息记录介质中; 将所述第一变形率变更为与所述第一变形率不同的第二变形率; 并以第二变形率在全息记录介质中记录第二全息图以形成记录的全息介质。

公开(公告)号：US20070117225A1

公开(公告)日：2007-05-24

申请号：US11285331

申请日：2005-11-21

Applicant: Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

Inventor： Kevin Capaldo ,  Mark Cheverton ,  Dennis Coyle ,  Michael Davis ,  Sameer Talsania ,  Masako Yamada ,  Chung-hei Yeung

IPC: H01L21/66

CPC classification number: G01N21/95 ,  G01N21/8422 ,  G01N21/8806

Abstract: A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

Abstract translation: 用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。 制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。 每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。 将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。

公开(公告)号：US20070114693A1

公开(公告)日：2007-05-24

申请号：US11285137

申请日：2005-11-21

Applicant: Paul Buckley ,  Kevin Capaldo ,  Jamuna Chakravarti ,  Mark Cheverton ,  David Clinnin ,  Michael Davis ,  Robert Little ,  Vijay Paruchuru ,  Micah Sze ,  Sameer Talsania ,  Vicki Watkins ,  Masako Yamada ,  Jana York ,  Kenneth Zarnoch

Inventor： Paul Buckley ,  Kevin Capaldo ,  Jamuna Chakravarti ,  Mark Cheverton ,  David Clinnin ,  Michael Davis ,  Robert Little ,  Vijay Paruchuru ,  Micah Sze ,  Sameer Talsania ,  Vicki Watkins ,  Masako Yamada ,  Jana York ,  Kenneth Zarnoch

IPC: B29C73/00 ,  B29C45/76

CPC classification number: B29C37/0053 ,  B29C37/0096 ,  C25F1/00

Abstract: Disclosed herein is a method comprising inspecting a mold for a defect; determining a type of defect present on the mold; sorting the mold by type of defect present; treating the mold with a cleaning process that is suitable to remove the defect; and pressing the mold against a polymeric film to produce a series of defect free light management films; wherein the yield of light management films manufactured from the mold is higher than the yield of light management films that are produced from a comparative mold that has not been treated with the cleaning process.

Abstract translation: 本文公开了一种检查缺陷的模具的方法; 确定模具上存在的缺陷类型; 按存在的缺陷类型对模具进行分选; 用适合去除缺陷的清洁工艺处理模具; 并将模具压在聚合物膜上以产生一系列无缺陷的光管理膜; 其中从模具制造的光管理膜的产量高于由未经过清洁处理的比较模具生产的光管理膜的产量。

公开(公告)号：US07199386B2

公开(公告)日：2007-04-03

申请号：US10710708

申请日：2004-07-29

Applicant: Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

Inventor： Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

IPC: G01N21/86 ,  G01N21/00 ,  H01L27/00

CPC classification number: G01N21/95 ,  G01N2021/9513

Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

Abstract translation: 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。 最后，该系统包括可操作地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。