DISPLAY DEVICE AND METHOD OF MEASURING SURFACE STRUCTURE THEREOF
    11.
    发明申请
    DISPLAY DEVICE AND METHOD OF MEASURING SURFACE STRUCTURE THEREOF 有权
    显示装置及其表面结构的测量方法

    公开(公告)号:US20110128481A1

    公开(公告)日:2011-06-02

    申请号:US12779915

    申请日:2010-05-13

    Abstract: A display device and a method of measuring a surface structure of the same are provided. The display device includes first and second substrates, first and second patterned light-shielding layers, and first and second pixel units. The first patterned light-shielding layer disposed on a surface of the first substrate includes first openings. The second patterned light-shielding layer disposed on the surface of the first substrate in the first patterned light-shielding layer includes second openings. The first pixel unit includes first and second protrusions. The first protrusion correspondingly covers the first openings and a portion of the first patterned light-shielding layer. The second protrusion is disposed in the first and second patterned light-shielding layers. The second pixel unit includes a third protrusion correspondingly covering the second openings and a portion of the second patterned light-shielding layer, wherein sizes of the second openings are smaller than sizes of the first openings.

    Abstract translation: 提供显示装置和测量其表面结构的方法。 显示装置包括第一和第二基板,第一和第二图案化遮光层以及第一和第二像素单元。 设置在第一基板的表面上的第一图案化遮光层包括第一开口。 设置在第一图案化遮光层中的第一基板的表面上的第二图案遮光层包括第二开口。 第一像素单元包括第一和第二突起。 第一突起相应地覆盖第一开口和第一图案化遮光层的一部分。 第二突起设置在第一和第二图案化的遮光层中。 第二像素单元包括对应地覆盖第二开口的第三突起和第二图案化遮光层的一部分,其中第二开口的尺寸小于第一开口的尺寸。

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