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11.发明申请公开(公告)号：US20190219610A1
公开(公告)日：2019-07-18
申请号：US16302142
申请日：2017-05-18
发明人： Alexander Mihaylovich ALEKSEEV , Aleksey Dmitrievich VOLKOV , Dmitry Yurjevich SOKOLOV , Anton Evgenievich EFIMOV
摘要： The invention relates to the field of probe measurements of objects after micro- and nano-sectioning. The essence of the invention consists in that in a wide-field scanning probe microscope combined with an apparatus for modifying an object, said microscope comprising a base on which a piezo-scanner unit having a piezo scanner, a probe unit having a probe holder, and a punch unit having a punch are movably mounted, a punch actuator is configured as a three-axis actuator, allowing the punch to move along a first axis X, a second axis Y and a third axis Z; and the probe unit is mounted on the punch actuator. The invention is aimed at simplifying the structure of the device by combining into one unit means for measuring and means for modifying an object. The technical result of the invention consists in increasing measurement resolution.
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公开(公告)号：US20190219608A1
公开(公告)日：2019-07-18
申请号：US16302153
申请日：2017-05-18
发明人： Alexander Mihaylovich ALEKSEEV , Aleksey Dmitrievich VOLKOV , Dmitry Yurjevich SOKOLOV , Anton Evgenievich EFIMOV
CPC分类号： G01Q10/04 , G01Q30/025 , G01Q30/10 , G01Q30/20
摘要： The invention relates to the field of probe measurements of objects after micro- and nano-sectioning. The essence of the invention consists in that in a scanning probe nanotomograph having an optical analysis module and comprising a base, on which a piezo-scanner unit, a probe unit and a punching unit are mounted, a sixth actuator is introduced, which is installed on said base, on which an optical analysis module is fastened, which comprises a lens and an analyser, optically connected to each other; moreover, the sixth actuator facilitates displacement of the optical analysis module along the third axis Z. The invention aims at expanding functional capabilities by means of using the optical analysis module. The technical result of the invention consists in enabling the optical observation and study of objects while same are being sectioned, which expands the functional capabilities of the apparatus.
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公开(公告)号：US20190113395A1
公开(公告)日：2019-04-18
申请号：US16090354
申请日：2017-04-04
摘要： An effective and highly accurate method for measuring temperature during thermal tumor ablation to increase ablation accuracy installing a fiber optic temperature sensor with a linearly chirped (the variation of the refractive index has a period growing in an algebraic progression) Bragg grating with a length of 1.4-6 cm and a diameter of 80-300 μm using a catheter directly on the tumor. Through the fiber optic sensor with a length of 1.4-6 cm and a diameter of 80-300 μm is passed a light spectrum, which undergoes backscatter due to the Bragg grating, dependent on the temperature acting on the sensor. Subsequently, using the backscatter light spectrum decoding software, developed according to the fiber optic cable parameters, the temperature profile is displayed on the computer. The method has applications in medicine, in particular oncology.
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14.发明申请公开(公告)号：US20170350921A1
公开(公告)日：2017-12-07
申请号：US15541669
申请日：2015-07-10
发明人： Alexander Alekseev , Aleksey Dmitriyevich Volkov , Dmitry Yuryevich Sokolov , Anton Evgeniyevich Efimov
CPC分类号： G01Q30/20 , G01N1/06 , G01N1/42 , G01N2001/2873 , G01Q10/00
摘要： The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.
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