公开(公告)号：US20100127757A1

公开(公告)日：2010-05-27

申请号：US12277495

申请日：2008-11-25

Applicant: Rei-Fu Huang

Inventor： Rei-Fu Huang

IPC: H01H37/76

CPC classification number: H01H37/761 ,  H01H85/0241 ,  H01L23/5256 ,  H01L2924/0002 ,  H01L2924/3011 ,  H01L2924/00

Abstract: An exemplary embodiment of an efuse device is provided, operating in a write mode and a read mode and comprising a source line, a cell, a blow device, and a sensing circuit. The cell has a first terminal coupled to the source line and a second terminal. The blow device is coupled between the second terminal of the cell and a ground terminal. The blow device is turned on in the read mode. The sensing circuit is coupled to the first terminal of the cell and the ground terminal, and is arranged to determine a state of the cell.

Abstract translation: 提供了以写入模式和读取模式操作并且包括源极线，电池，吹风装置和感测电路的充电装置的示例性实施例。 电池具有耦合到源极线的第一端子和第二端子。 吹风装置连接在电池的第二端子和接地端子之间。 吹扫装置在读取模式下打开。 感测电路耦合到单元的第一端子和接地端子，并且被布置成确定单元的状态。

公开(公告)号：US07228468B2

公开(公告)日：2007-06-05

申请号：US11001345

申请日：2004-11-30

Applicant: Cheng-Wen Wu ,  Rei-Fu Huang ,  Chin-Lung Su ,  Wen-Ching Wu ,  Yeong-Jar Chang ,  Kun-Lun Luo ,  Shen-Tien Lin

Inventor： Cheng-Wen Wu ,  Rei-Fu Huang ,  Chin-Lung Su ,  Wen-Ching Wu ,  Yeong-Jar Chang ,  Kun-Lun Luo ,  Shen-Tien Lin

IPC: G11C29/00

CPC classification number: G11C29/4401 ,  G11C29/16 ,  G11C29/44 ,  G11C29/72 ,  G11C2029/0405 ,  G11C2029/3602

Abstract: The present invention provides a method and apparatus for a memory build-in self-diagnosis and repair with syndrome identification. It uses a fail-pattern identification and a syndrome-format structure to identify faulty rows, faulty columns and single faulty word in the memory during the testing process, then exports the syndrome information. Based on the syndrome information, a redundancy analysis algorithm is applied to allocate the spare memory elements repairing the faulty memory cells. It has a sequencer with enhanced fault syndrome identification, a build-in redundancy-analysis circuit with improved redundancy utilization, and an address reconfigurable circuit with reduced timing penalty during normal access. The invention reduces the occupation time and the required capture memory space in the automatic test equipment. It also increases the repair rate and reduces the required area overhead.

Abstract translation: 本发明提供一种存储器建立自诊断和修复的方法和装置，其具有综合征识别。 它在测试过程中使用故障模式识别和故障排序格式结构来识别存储器中的故障行，故障列和单个故障字，然后输出故障信息。 基于综合信息，应用冗余分析算法来分配修复故障存储单元的备用存储单元。 它具有具有增强的故障综合征识别的定序器，具有改进的冗余利用率的内置冗余分析电路，以及在正常访问期间减少定时损失的地址可重新配置电路。 本发明减少了自动测试设备中的占用时间和所需的捕获存储空间。 它还增加了修复率，并减少了所需的面积开销。

公开(公告)号：US09171639B2

公开(公告)日：2015-10-27

申请号：US13397989

申请日：2012-02-16

Applicant: Rei-Fu Huang ,  Jin-Bin Yang

Inventor： Rei-Fu Huang ,  Jin-Bin Yang

IPC: G01R31/02 ,  G11C17/18 ,  H01L23/525

CPC classification number: G11C17/18 ,  H01L23/5256 ,  H01L2924/0002 ,  H01L2924/00

Abstract: An eFuse with at least one fuse unit is provided. The fuse unit includes a first common node providing a first reference voltage, a second common node providing a second reference voltage, at least one fuse coupled to the first common node, and a determining unit coupled between the fuse and the second common node, generating an output signal indicating whether the fuse is blown or not according to a first condition in a normal mode and a second condition in a test mode.

Abstract translation: 提供至少一个保险丝单元的eFuse。 保险丝单元包括提供第一参考电压的第一公共节点，提供第二参考电压的第二公共节点，耦合到第一公共节点的至少一个熔丝以及耦合在熔丝和第二公共节点之间的确定单元，产生 根据正常模式中的第一状态和测试模式中的第二状态，指示熔丝是否熔断的输出信号。

公开(公告)号：US08134854B2

公开(公告)日：2012-03-13

申请号：US12277495

申请日：2008-11-25

Applicant: Rei-Fu Huang

Inventor： Rei-Fu Huang

IPC: G11C17/00

CPC classification number: H01H37/761 ,  H01H85/0241 ,  H01L23/5256 ,  H01L2924/0002 ,  H01L2924/3011 ,  H01L2924/00

Abstract: An exemplary embodiment of an efuse device is provided, operating in a write mode and a read mode and comprising a source line, a cell, a blow device, and a sensing circuit. The cell has a first terminal coupled to the source line and a second terminal. The blow device is coupled between the second terminal of the cell and a ground terminal. The blow device is turned on in the read mode. The sensing circuit is coupled to the first terminal of the cell and the ground terminal, and is arranged to determine a state of the cell.

Abstract translation: 提供了以写入模式和读取模式操作并且包括源极线，电池，吹风装置和感测电路的充电装置的示例性实施例。 电池具有耦合到源极线的第一端子和第二端子。 吹风装置连接在电池的第二端子和接地端子之间。 吹扫装置在读取模式下打开。 感测电路耦合到单元的第一端子和接地端子，并且被布置成确定单元的状态。

公开(公告)号：US08050129B2

公开(公告)日：2011-11-01

申请号：US12491247

申请日：2009-06-25

Applicant: Chia-Hsien Liu ,  Rei-Fu Huang ,  Chien-Chung Chen ,  Che-Yuan Jao

Inventor： Chia-Hsien Liu ,  Rei-Fu Huang ,  Chien-Chung Chen ,  Che-Yuan Jao

IPC: G11C7/00

CPC classification number: G04B37/0481 ,  G04B19/065

Abstract: An electrically programmable fuse (e-fuse) apparatus includes an e-fuse macro and a switch device. The e-fuse macro is disposed in an integrated circuit, and has a plurality of e-fuse units. The switch device is disposed in the integrated circuit, and has an output node coupled to the e-fuse units and a first input node coupled to a first power source which supplies a first reference voltage acting as a programming voltage of the e-fuse macro. The switch device connects the first power source to the e-fuse units when the e-fuse macro is operated under a programming mode.

Abstract translation: 电可编程保险丝（e-fuse）装置包括电子熔丝宏和开关装置。 电子熔丝宏设置在集成电路中，并且具有多个电子熔丝单元。 开关装置设置在集成电路中，并且具有耦合到电子熔丝单元的输出节点和耦合到第一电源的第一输入节点，第一电源提供充当电子熔丝宏的编程电压的第一参考电压 。 当在编程模式下操作电子熔丝宏时，开关装置将第一电源连接到电子熔丝单元。

公开(公告)号：US20090039462A1

公开(公告)日：2009-02-12

申请号：US12128650

申请日：2008-05-29

Applicant: Rei-Fu Huang

Inventor： Rei-Fu Huang

IPC: H01H37/76 ,  H01L21/00

CPC classification number: G11C17/16 ,  G11C17/18

Abstract: An exemplary embodiment of an efuse device is provided and comprises a plurality of word lines, at least one bit line, a plurality of cells, a plurality of first selection devices, and at least one second selection device. The word lines are interlaced with the bit line. The cells are disposed in an array, and each corresponds to one set of the interlaced word line and bit line. Each first selection device is coupled to one of the word lines, and the second selection device is coupled to the bit line.

Abstract translation: 提供了一种efuse设备的示例性实施例，并且包括多个字线，至少一个位线，多个单元，多个第一选择装置和至少一个第二选择装置。 字线与位线交错。 单元被布置成阵列，并且每个单元对应于一组隔行字线和位线。 每个第一选择装置耦合到字线中的一个，并且第二选择装置耦合到位线。

公开(公告)号：US20070288807A1

公开(公告)日：2007-12-13

申请号：US11742567

申请日：2007-04-30

Applicant: Cheng-Wen Wu ,  Rei-Fu Huang ,  Chin-Lung Su ,  Wen-Ching Wu ,  Kun-Lun Luo

Inventor： Cheng-Wen Wu ,  Rei-Fu Huang ,  Chin-Lung Su ,  Wen-Ching Wu ,  Kun-Lun Luo

IPC: G11C29/12

CPC classification number: G11C29/44 ,  G11C29/4401 ,  G11C29/72

Abstract: Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.

Abstract translation: 公开了一种在具有综合征识别的记忆中的内置自诊断和修复方法和装置。 它在存储器测试期间应用故障模式识别和综合征格式结构来识别存储器中的至少一种类型的故障综合征，然后产生并输出与相应的故障综合征相关的故障综合征信息。 根据故障综合信息，该方法应用冗余分析算法，分配备用存储器元件并修复存储器中的故障单元。 综合征格式结构分别针对不良故障综合征，如有缺陷的行段和单一故障字，分别应用单故障字综合征格式，故障行段综合征格式和故障列段综合征格式， 列段和单个故障单词，所有单个故障字，故障行段和故障列段等。