Methods and apparatus for ion beam angle measurement in two dimensions
    11.
    发明授权
    Methods and apparatus for ion beam angle measurement in two dimensions 有权
    二维离子束角度测量的方法和装置

    公开(公告)号:US07202483B2

    公开(公告)日:2007-04-10

    申请号:US11099119

    申请日:2005-04-05

    IPC分类号: G01K1/08 H01J3/14

    摘要: An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion beam, and a sensing device to detect the ion beam for different flag positions along the translation path and produce a sensor signal having a first signal component representative of the first feature and a second signal component representative of the second feature. The first and second signal components and corresponding positions of the flag are representative of an angle of the ion beam in a direction orthogonal to the translation path. The sensing device may be a two-dimensional array of beam current sensors. The system may provide measurements of horizontal and vertical beam angles while translating the flag in only one direction.

    摘要翻译: 用于离子束的角度测量系统包括限定第一和第二特征的标志,其中第二特征具有与第一特征可变的间隔,沿着平移路径平移标记的机构,使得标记拦截至少一部分 离子束和感测装置,用于检测沿着平移路径的不同标志位置的离子束,并产生具有代表第一特征的第一信号分量和表示第二特征的第二信号分量的传感器信号。 标志的第一和第二信号分量和对应的位置代表垂直于平移路径的方向上离子束的角度。 感测装置可以是束电流传感器的二维阵列。 该系统可以提供水平和垂直波束角度的测量,同时仅在一个方向上翻译标志。

    Methods and apparatus for ion beam angle measurement in two dimensions
    12.
    发明申请
    Methods and apparatus for ion beam angle measurement in two dimensions 有权
    二维离子束角度测量的方法和装置

    公开(公告)号:US20060219936A1

    公开(公告)日:2006-10-05

    申请号:US11099119

    申请日:2005-04-05

    IPC分类号: G01K1/08 H01J3/14

    摘要: An angle measurement system for an ion beam includes a flag defining first and second features, wherein the second feature has a variable spacing from the first feature, a mechanism to translate the flag along a translation path so that the flag intercepts at least a portion of the ion beam, and a sensing device to detect the ion beam for different flag positions along the translation path and produce a sensor signal having a first signal component representative of the first feature and a second signal component representative of the second feature. The first and second signal components and corresponding positions of the flag are representative of an angle of the ion beam in a direction orthogonal to the translation path. The sensing device may be a two-dimensional array of beam current sensors. The system may provide measurements of horizontal and vertical beam angles while translating the flag in only one direction.

    摘要翻译: 用于离子束的角度测量系统包括限定第一和第二特征的标志,其中第二特征具有与第一特征可变的间隔,沿着平移路径平移标记的机构,使得标记拦截至少一部分 离子束和感测装置,用于检测沿着平移路径的不同标志位置的离子束,并产生具有代表第一特征的第一信号分量和表示第二特征的第二信号分量的传感器信号。 标志的第一和第二信号分量和对应的位置代表垂直于平移路径的方向上离子束的角度。 感测装置可以是束电流传感器的二维阵列。 该系统可以提供水平和垂直波束角度的测量,同时仅在一个方向上翻译标志。