公开(公告)号：US20040222305A1

公开(公告)日：2004-11-11

申请号：US10458696

申请日：2003-06-10

Applicant: STMicroelectronics, Inc. ,  State of Incorporation: Delaware

Inventor： Taylor J. Leaming

IPC: G06K019/06

CPC classification number: G01R31/318555 ,  G01R31/3025 ,  G01R31/31719 ,  G06F11/267 ,  G06F11/27 ,  G06K7/0013 ,  G06K7/0095 ,  G06K7/10465 ,  G06K19/07 ,  G06K19/07733

Abstract: An integrated circuit for a smart card may include a transceiver for communicating with a host device and a Joint Test Action Group (JTAG) test controller for performing at least one test operation. Further, the integrated circuit may also include a processor for causing the JTAG test controller to initiate the at least one test operation based upon receiving at least one test request from the host device via the transceiver. More particularly, the processor may convert the at least one test request to JTAG data for the JTAG test controller. That is, the integrated circuit advantageously allows communications between the host device and the JTAG controller via a system bus, for example, without the need for a dedicated JTAG test access port (TAP) which is typically required for accessing JTAG controllers.

Abstract translation: 用于智能卡的集成电路可以包括用于与主机设备通信的收发器和用于执行至少一个测试操作的联合测试动作组（JTAG）测试控制器。 此外，集成电路还可以包括处理器，用于使得JTAG测试控制器基于经由收发器从主机设备接收至少一个测试请求来发起至少一个测试操作。 更具体地，处理器可以将至少一个测试请求转换为用于JTAG测试控制器的JTAG数据。 也就是说，集成电路有利地允许例如通过系统总线在主机设备和JTAG控制器之间进行通信，而不需要通常需要访问JTAG控制器的专用JTAG测试访问端口（TAP）。