公开(公告)号：US09733384B2

公开(公告)日：2017-08-15

申请号：US14418895

申请日：2013-10-03

Applicant: System Square Inc.

Inventor： Atsushi Suzuki ,  Noriaki Ikeda

IPC: G01N21/59 ,  G01N21/3581 ,  G01V5/00 ,  G01V8/10 ,  G01V11/00

CPC classification number: G01V5/0016 ,  G01N21/3581 ,  G01V8/10 ,  G01V11/00

Abstract: A package inspection system is provided, where an electromagnetic-wave detection part is hardly affected by illumination light for optical detection. Below a gap 6c of a conveyor mechanism 6 for conveying a package, provided are an X-ray sensor 13 for detecting X rays transmitted through the package and an illumination part 16 for applying illumination light to the gap 6c. The X-ray sensor 13 and the illumination part 16 are separated from each other by a partition 42. A light-shielding member 43 is placed in the path of X-ray incidence to the X-ray sensor 13. The light-shielding member 43 is formed of a material that allows passage of the X rays but does not allow passage of the illumination light and is hardly deteriorated by irradiation of the X rays, e.g., a carbon sheet.