Foldable force sensing device
    11.
    发明授权

    公开(公告)号:US11269440B1

    公开(公告)日:2022-03-08

    申请号:US16991062

    申请日:2020-08-12

    摘要: A force sensing device includes a sensor array, a first substrate, a second substrate and a plurality of electrodes. The first substrate has a sensor region and a side region. The second substrate has a sensor region and a side region. The sensor array is formed above the sensor region of the first substrate. The plurality of electrodes are formed on the sensor region and the side region of the first substrate and below the sensor region and the side region of the second substrate, and coupled to the sensor array. The side region of the first substrate, the side region of the second substrate and the plurality of electrodes on the side region are foldable to a back side of the sensor array.

    Light emitting key
    12.
    发明授权
    Light emitting key 有权
    发光键

    公开(公告)号:US09070499B2

    公开(公告)日:2015-06-30

    申请号:US13893825

    申请日:2013-05-14

    IPC分类号: H01C10/12 H01H13/02

    摘要: A light emitting key is disclosed. A through hole is made through piezoresistive layer; a light source is arranged under the bottom of the light emitting key. When the light source is turned on, light beams shall emit out of the top substrate. The light emitting effect of the key facilitates it to be used in a dark area such as an aircraft flying in the night sky.

    摘要翻译: 公开了一种发光键。 通孔通过压阻层制成; 光源设置在发光键的底部下方。 当光源打开时,光束将从顶部基板发出。 钥匙的发光效果有助于它在黑暗的地方使用,如在夜空中飞行的飞机。

    TEST SYSTEM FOR A DOME SWITCH
    13.
    发明申请
    TEST SYSTEM FOR A DOME SWITCH 审中-公开
    DOME开关测试系统

    公开(公告)号:US20140184231A1

    公开(公告)日:2014-07-03

    申请号:US13731433

    申请日:2012-12-31

    IPC分类号: G01R31/327

    摘要: A test system having a piece of film type pressure sensor configured under a dome switch for collecting a physical parameter selected from a group consisted of Actuation Force (AF), Timing T1, Contact Force (CF), Timing T2, On-Force (OF), Snap Ratio, and Key Journey of the dome switch is provided to facilitate product sorting according to one of the parameters.

    摘要翻译: 一种具有薄膜式压力传感器的测试系统,其配置在一个圆顶开关下,用于收集从由激励力(AF),定时T1,接触力(CF),定时T2,导通力(OF) ),按钮比例和按键行程提供,以便根据其中一个参数进行产品分类。

    RESISTIVE INPUT SYSTEM WITH RESISTOR MATRIX
    14.
    发明申请
    RESISTIVE INPUT SYSTEM WITH RESISTOR MATRIX 有权
    具有电阻矩阵的电阻输入系统

    公开(公告)号:US20150349774A1

    公开(公告)日:2015-12-03

    申请号:US14825847

    申请日:2015-08-13

    IPC分类号: H03K17/96 G06F3/045

    摘要: A resistive input system is disclosed, which includes a resistor matrix. The resistor matrix includes M first traces, N second traces, and M*N resistors. First ends of the resistors of a same column are coupled to one of the M first traces, second ends of the resistors of a same row are coupled to one of the N second traces, M is integers greater than 1, and N is integers greater than and equal to 1. The M*N resistors include variable resistors. A measurement circuit measures variations of a first voltage level of each of the second traces while a power control circuit provides the first voltage to the one of the M first traces and the second voltage to the rest of the M first traces. At least one input point is determined according to the variation of the first voltage level of each of the second traces.

    摘要翻译: 公开了一种电阻输入系统,其包括电阻矩阵。 电阻矩阵包括M个第一迹线,N个第二迹线和M * N个电阻。 相同列的电阻器的第一端耦合到M个第一迹线中的一个,同一行的电阻器的第二端耦合到N个第二迹线中的一个,M是大于1的整数,N是更大的整数 M * N电阻包括可变电阻。 测量电路测量每个第二迹线的第一电压电平的变化,而功率控制电路将第一电压提供给M个第一迹线中的一个,而将第二电压提供给M个第一迹线的其余部分。 至少一个输入点根据每个第二迹线的第一电压电平的变化来确定。

    Method for controlling operations of input device having resistor matrix
    15.
    发明授权
    Method for controlling operations of input device having resistor matrix 有权
    用于控制具有电阻矩阵的输入装置的操作的方法

    公开(公告)号:US09164643B2

    公开(公告)日:2015-10-20

    申请号:US14147568

    申请日:2014-01-05

    IPC分类号: G01L1/22 G06F3/045 H03K17/96

    CPC分类号: G06F3/045 H03K17/9625

    摘要: A method for controlling an input device is provided. The input device has a resistor matrix having M first traces, N second traces and M×N resistors. Each second trace is coupled to a reference resistor and M−1 variable resistors. M and N are integers greater than 1. A first voltage level of each second trace is measured when a first voltage is applied to a first end of the reference resistor and a second voltage is applied to first ends of the M−1 variable resistors via the M first traces. Variations of the first voltage level of each second trace are measured, such that it could be determined whether any touch point of the input device exists according to the variations of the first voltage level of each second trace.

    摘要翻译: 提供了一种用于控制输入装置的方法。 输入装置具有具有M个第一迹线,N个第二迹线和M×N个电阻器的电阻器矩阵。 每个第二个迹线耦合到参考电阻和M-1个可变电阻。 M和N是大于1的整数。当第一电压施加到参考电阻器的第一端并且第二电压被施加到M-1可变电阻器的第一端时,测量每个第二迹线的第一电压电平, M第一痕迹。 测量每个第二迹线的第一电压电平的变化,使得可以根据每个第二迹线的第一电压电平的变化来确定输入设备的任何接触点是否存在。