公开(公告)号：US20200165721A1

公开(公告)日：2020-05-28

申请号：US16075914

申请日：2016-02-12

Applicant: Neil MORRISON ,  Jürgen HENRICH ,  Florian RIES ,  Tobias STOLLEY ,  Andreas SAUER ,  Wolfgang BUSCHBECK ,  Applied Materials, Inc.

Inventor： Neil MORRISON ,  Jürgen HENRICH ,  Florian RIES ,  Tobias STOLLEY ,  Andreas SAUER ,  Wolfgang BUSCHBECK

IPC: C23C14/56 ,  C23C16/54 ,  B65G39/18 ,  B05C9/14 ,  B05C1/08 ,  C23C16/458 ,  C23C16/511

Abstract: A vacuum processing system for a flexible substrate is provided. The vacuum processing system includes a first chamber adapted for housing a supply roll for providing the flexible substrate; a second chamber adapted for housing a take-up roll for storing the flexible substrate after processing; a substrate transport arrangement including one or more guide rollers for guiding the flexible substrate from the first chamber to the second chamber; a maintenance zone between the first chamber and the second chamber wherein the maintenance zone allows for maintenance access to or of at least one of the first chamber and the second chamber; and a first process chamber for processing the flexible substrate.

公开(公告)号：US20180372650A1

公开(公告)日：2018-12-27

申请号：US16062073

申请日：2016-01-15

Applicant: Applied Materials, Inc.

Inventor： Fabio PIERALISI ,  Florian RIES

IPC: G01N21/89 ,  C23C14/54 ,  G01N21/896 ,  G01N21/84 ,  G01N21/86

Abstract: According to one aspect of the present disclosure, an optical inspection system for inspecting a flexible substrate is provided. The system includes a substrate support with an at least partially convex substrate support surface configured to guide the substrate along a substrate transportation path, the substrate support being arranged on a first side of the substrate transportation path; a light source arranged on a second side of the substrate transportation path and configured to direct a light beam through a portion of the substrate which is supported on and in contact with the convex substrate support surface; and a light detector for conducting a transmission measurement of the substrate. According to a further aspect of the present disclosure, methods of inspecting a flexible substrate are provided.