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公开(公告)号：US5303165A
公开(公告)日：1994-04-12
申请号：US834448
申请日：1992-02-12
申请人： Alan M. Ganz , David H. Tracy , Robert A. Hoult
发明人： Alan M. Ganz , David H. Tracy , Robert A. Hoult
CPC分类号： G01J3/2803 , G01J3/28 , G01J2003/2866
摘要： A spectrometric instrument which exhibits an intrinsic profile for a sharp spectral line produces profile data for narrow spectral lines. The spectral lines are effected with a high finesse etalon of gold coated polymer. A transformation filter is computed for transforming the profile data to a gaussian profile. A wavelength calibration is combined with the filter to effect a correction matrix which is applied to sample data to generate calibrated standardized data. Iteratively a correction matrix is applied to calibration data to generate standardized calibration data which is utilized for the wavelength calibration. Calibration is effected with an optical standard, an interference etalon and a fringe formula. Etalon effective thickness is first estimated and then precisely determined so that fringe peaks calibrate wavelength.
摘要翻译： 显示锋利光谱线的固有分布的光谱仪可以产生窄谱线的谱图数据。 光谱线用金涂层聚合物的高精密标准具实现。 计算转换滤波器以将简档数据变换为高斯分布。 波长校准与滤波器组合以实现校正矩阵，其被应用于采样数据以产生校准的标准化数据。 迭代地将校正矩阵应用于校准数据以产生用于波长校准的标准化校准数据。 用光学标准，干涉标准具和边缘公式进行校准。 首先估计Etalon有效厚度，然后精确确定边缘峰值校准波长。
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公开(公告)号：US5229838A
公开(公告)日：1993-07-20
申请号：US823631
申请日：1992-01-21
申请人： Alan M. Ganz , David H. Tracy
发明人： Alan M. Ganz , David H. Tracy
CPC分类号： G01J1/08 , G01N21/274
摘要： To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.
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