Abstract:
In a method and apparatus for detecting toxic chemical hazardous materials and warfare agents in a gas, the gas is exposed to a substrate with a hydrogen terminated surface. The substrate may be made from a nonconductor material with available surface conductivity, or from a semiconductor material. The electrical resistance at the hydrogen terminated surface is measured to detect the presence of the hazardous materials and warfare agents. A method of producing such a substrate detector is also disclosed.
Abstract:
The present invention relates to a device (1) for detecting chemical or biological substances, having an analytical instrument (2) for detecting the substances and for providing information concerning the qualitative or quantitative presence of the substances, wherein the device (1) additionally has a contamination sensor (3) which is constructed for measuring the degree of contamination of the analytical instrument (2) and/or of the device (1).