Micro light emitting diode testing
    11.
    发明授权

    公开(公告)号:US10930201B1

    公开(公告)日:2021-02-23

    申请号:US15910906

    申请日:2018-03-02

    Applicant: Apple Inc.

    Abstract: Methods and systems for testing a display having an array of microdrivers arranged in multiple of rows and columns including setting a testing mode of a microdriver of the array of microdrivers using multiple pins of the microdriver that are used in scanning or operation modes of the microdriver. The microdriver is configured to light one or more connected micro light emitting diode pixels coupled to the microdriver during the testing mode. Testing also includes operating the microdriver in the testing mode and determining functionality of the one or more connected micro light emitting diode pixels or the microdriver based on the testing mode.

    SPATIOTEMPORAL DITHER FOR PULSED DIGITAL DISPLAY SYSTEMS AND METHODS

    公开(公告)号:US20240021132A1

    公开(公告)日:2024-01-18

    申请号:US18318484

    申请日:2023-05-16

    Applicant: Apple Inc.

    Abstract: In accordance with embodiments of the present disclosure, a device may include a pulsed emission electronic display having multiple display pixels in order to display an image frame. The display may pulse one or more display pixels of over a plurality of sub-frames within the image frame based on display image data. The device may also include image processing circuitry to generate the display image data based on source image data indicative of an image to be displayed during the image frame. Additionally, the image processing circuitry may dither an order of the plurality of sub-frames.

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